MENTOR GRAPHICS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 82395
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 20433
 
 
 
G11C STATIC STORES 39112
 
 
 
H03K PULSE TECHNIQUE 29102
 
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2876
 
 
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 22263
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 14348
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 10188
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 8127
 
 
 
G06G ANALOGUE COMPUTERS 647

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0067,488 SITUATIONAL AWARENESS DETERMINATION BASED ON AN ANNOTATED ENVIRONMENTAL MODELSep 08, 16Mar 08, 18[G06N, H04W, B60W, G05D]
2018/0067,489 LOW-LEVEL SENSOR FUSIONOct 06, 16Mar 08, 18[G05D]
2018/0067,490 PRE-TRACKING SENSOR EVENT DETECTION AND FUSIONJan 20, 17Mar 08, 18[G06N, G05D]
2018/0067,495 EVENT-DRIVEN REGION OF INTEREST MANAGEMENTOct 06, 16Mar 08, 18[G08G, B60W, G05D]
2018/0068,206 OBJECT RECOGNITION AND CLASSIFICATION USING MULTIPLE SENSOR MODALITIESSep 08, 16Mar 08, 18[G06K]
2018/0052,950 Acceleration Of Voltage Propagation Based On Local IterationAug 17, 16Feb 22, 18[G06F]
2018/0052,951 Acceleration Of Voltage Propagation Based On Device Chain ReductionAug 17, 16Feb 22, 18[G06F]
2018/0045,780 TIMING-AWARE TEST GENERATION AND FAULT SIMULATIONJul 31, 17Feb 15, 18[G01R, G06F]
2018/0032,357 DEBUG ENVIRONMENT FOR A MULTI USER HARDWARE ASSISTED VERIFICATION SYSTEMJul 10, 17Feb 01, 18[G06F]
2018/0017,622 CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELECTIVE COMPACTION OF TEST RESPONSESMay 30, 17Jan 18, 18[G01R]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9915702 Channel sharing for testing circuits having non-identical coresNov 26, 14Mar 13, 18[G01R]
9910943 Distributed state and data functional coverageJan 31, 14Mar 06, 18[G06F]
9898388 Non-intrusive software verificationMay 26, 15Feb 20, 18[G06F]
9898562 Distributed state and data functional coverageJan 30, 14Feb 20, 18[G06F]
9898563 Modeling memory in emulation based on cacheNov 13, 15Feb 20, 18[G06F]
9886178 User interfacesMar 14, 14Feb 06, 18[G06T, G06F]
9887884 Cloud services platformMar 17, 14Feb 06, 18[H04N, H04L, G06Q, G06F]
9881113 Layout synthesis of a three-dimensional mechanical system designJun 17, 15Jan 30, 18[G06F]
9874606 Selective per-cycle masking of scan chains for system level testJun 21, 16Jan 23, 18[G01R, G06F]
9857421 Dynamic design partitioning for diagnosisMay 04, 16Jan 02, 18[G01R, G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0132,434 MEASURE VARIATION TOLERANT PHYSICAL UNCLONABLE FUNCTION DEVICEABANNov 24, 15May 11, 17[G06F]
2016/0342,728 Visualization Of Analysis Process Parameters For Layout-Based ChecksABANMay 19, 15Nov 24, 16[G06F]
2016/0140,278 Modeling Photoresist Shrinkage Effects In LithographyABANJan 25, 16May 19, 16[G06F]
2015/0252,932 MULTI-PART, TAPERED, CONCENTRIC MANIFOLD AND METHOD OF MAKING THE MANIFOLDABANMay 19, 15Sep 10, 15[F16L]
9009643 Density-based integrated circuit design adjustmentWithdrawnAug 19, 13Apr 14, 15[G06F]
8984460 Defect injection for transistor-level fault simulationWithdrawnAug 22, 13Mar 17, 15[G06F]
2015/0067,621 Logic-Driven Layout Pattern AnalysisABANSep 05, 13Mar 05, 15[G06F]
2014/0337,810 MODULAR PLATFORM FOR INTEGRATED CIRCUIT DESIGN ANALYSIS AND VERIFICATIONABANDec 16, 13Nov 13, 14[G06F]
2014/0330,529 IDENTIFICATION OF FLUID FLOW BOTTLENECKSABANMar 26, 14Nov 06, 14[G01F]
2014/0313,542 CLOUD SERVICES PLATFORMABANMar 17, 14Oct 23, 14[G06F]
2014/0246,705 Programmable Leakage Test For Interconnects In Stacked DesignsABANMar 03, 14Sep 04, 14[G06F]
2014/0212,793 Multiresolution Mask WritingABANAug 14, 13Jul 31, 14[G03F]
2014/0201,694 Wrap Based Fill In Layout DesignsABANJan 15, 14Jul 17, 14[G06F]
2014/0040,848 Controllable Turn-Around Time For Post Tape-Out FlowABANFeb 14, 13Feb 06, 14[G06F]
2014/0040,850 ManufacturabilityABANJan 22, 13Feb 06, 14[G06F]
8631362 Circuit instance variation probability system and methodExpiredFeb 25, 13Jan 14, 14[G06F]
2013/0318,487 Programmable Circuit Characteristics AnalysisABANMay 23, 13Nov 28, 13[G06F]
2013/0318,531 Domain Bounding For Symmetric Multiprocessing SystemsABANFeb 19, 13Nov 28, 13[G06F]
2013/0305,111 Circuit And Method For Simultaneously Measuring Multiple Changes In DelayABANJul 15, 13Nov 14, 13[G01R]
2013/0263,074 Analog Rule Check WaiverABANMay 23, 13Oct 03, 13[G06F]

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