MENTOR GRAPHICS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 81694
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 20131
 
 
 
G11C STATIC STORES 39119
 
 
 
H03K PULSE TECHNIQUE 29100
 
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2872
 
 
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 21258
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 14341
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 9186
 
 
 
G06G ANALOGUE COMPUTERS 646
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 6125

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0285,490 Correcting EUV Crosstalk Effects For Lithography SimulationMar 29, 17Oct 05, 17[G03F]
2017/0286,588 Full-Chip Assessment Of Time-Dependent Dielectric BreakdownJul 01, 16Oct 05, 17[G06F]
2017/0286,592 Automatic Axial Thrust Analysis Of Turbomachinery DesignsMar 09, 17Oct 05, 17[G06F]
2017/0277,822 PRINTED CIRCUIT BOARD DESIGN FOR MANUFACTURING ACROSS MULTIPLE SUPPLIERSMar 27, 17Sep 28, 17[G06F]
2017/0270,235 FRAGMENTATION POINT AND SIMULATION SITE ADJUSTMENT FOR RESOLUTION ENHANCEMENT TECHNIQUESJun 07, 17Sep 21, 17[G03F, G06F]
2017/0262,324 EVENT QUEUE MANAGEMENT FOR EMBEDDED SYSTEMSFeb 15, 17Sep 14, 17[G06F]
2017/0264,718 COMMUNICATION CIRCUITRY IN AN ELECTRONIC CONTROL UNITMar 14, 17Sep 14, 17[H04L]
2017/0220,455 TEST CASE GENERATION USING A CONSTRAINT GRAPH SOLVERJan 29, 16Aug 03, 17[G06F]
2017/0220,729 Directed Self-Assembly-Aware Layout Decomposition For Multiple PatterningApr 13, 17Aug 03, 17[G06F]
2017/0221,197 VIDEO INSPECTION SYSTEM WITH AUGMENTED DISPLAY CONTENTJan 28, 16Aug 03, 17[G06T]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9811615 Simultaneous retargeting of layout features based on process window simulationOct 20, 15Nov 07, 17[G03F, G06F]
9811617 Regression nearest neighbor analysis for statistical functional coverageJan 30, 14Nov 07, 17[G01R, G06F]
9805156 Selective parasitic extractionDec 27, 13Oct 31, 17[G06F]
9798226 Pattern optical similarity determinationAug 24, 16Oct 24, 17[G03F, G06F]
9785736 Connectivity-aware layout data reduction for design verificationMar 19, 15Oct 10, 17[G06F]
9778316 Multi-stage test response compactorsFeb 01, 16Oct 03, 17[G01R]
9773085 System design managementJan 30, 15Sep 26, 17[G06F]
9767237 Target capture and replay in emulationNov 13, 15Sep 19, 17[G06F]
9747397 Multi-mode multi-corner clocktree synthesisMar 22, 16Aug 29, 17[G06T, G06F]
9747398 Managing and controlling the use of hardware resources on integrated circuitsApr 16, 14Aug 29, 17[G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
9009643 Density-based integrated circuit design adjustmentWithdrawnAug 19, 13Apr 14, 15[G06F]
8984460 Defect injection for transistor-level fault simulationWithdrawnAug 22, 13Mar 17, 15[G06F]
2015/0067,621 Logic-Driven Layout Pattern AnalysisABANSep 05, 13Mar 05, 15[G06F]
2014/0330,529 IDENTIFICATION OF FLUID FLOW BOTTLENECKSABANMar 26, 14Nov 06, 14[G01F]
2014/0246,705 Programmable Leakage Test For Interconnects In Stacked DesignsABANMar 03, 14Sep 04, 14[G06F]
2014/0212,793 Multiresolution Mask WritingABANAug 14, 13Jul 31, 14[G03F]
2014/0201,694 Wrap Based Fill In Layout DesignsABANJan 15, 14Jul 17, 14[G06F]
2014/0040,850 ManufacturabilityABANJan 22, 13Feb 06, 14[G06F]
2013/0318,487 Programmable Circuit Characteristics AnalysisABANMay 23, 13Nov 28, 13[G06F]
2013/0318,531 Domain Bounding For Symmetric Multiprocessing SystemsABANFeb 19, 13Nov 28, 13[G06F]
2013/0305,111 Circuit And Method For Simultaneously Measuring Multiple Changes In DelayABANJul 15, 13Nov 14, 13[G01R]
2013/0263,074 Analog Rule Check WaiverABANMay 23, 13Oct 03, 13[G06F]
2013/0254,581 Power Profiling For Embedded System DesignABANMay 15, 13Sep 26, 13[G06F]
2013/0246,987 Coexistence Of Multiple Verification Component Types In A Hardware Verification FrameworkABANFeb 06, 13Sep 19, 13[G06F]
2013/0227,500 Calculation System For Inverse MasksABANSep 19, 12Aug 29, 13[G06F]
2013/0132,917 Pattern Matching HintsABANNov 18, 11May 23, 13[G06F]
8375337 ManufacturabilityWithdrawnDec 12, 08Feb 12, 13[G06F]
2012/0209,556 Low Power Scan-Based TestingABANFeb 02, 12Aug 16, 12[G06F]
2012/0198,394 Method For Improving Circuit Design RobustnessABANJan 31, 11Aug 02, 12[G06F]
2012/0167,028 DESIGN-RULE-CHECK WAIVERABANNov 23, 11Jun 28, 12[G06F]

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