MENTOR GRAPHICS CORPORATION

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 82395
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 20433
 
 
 
G11C STATIC STORES 39112
 
 
 
H03K PULSE TECHNIQUE 29102
 
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2876
 
 
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 22263
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 14348
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 10188
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 8127
 
 
 
G06G ANALOGUE COMPUTERS 647

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0067,488 SITUATIONAL AWARENESS DETERMINATION BASED ON AN ANNOTATED ENVIRONMENTAL MODELSep 08, 16Mar 08, 18[G06N, B60W, G05D, H04W]
2018/0067,490 PRE-TRACKING SENSOR EVENT DETECTION AND FUSIONJan 20, 17Mar 08, 18[G06N, G05D]
2018/0068,206 OBJECT RECOGNITION AND CLASSIFICATION USING MULTIPLE SENSOR MODALITIESSep 08, 16Mar 08, 18[G06K]
2018/0052,951 Acceleration Of Voltage Propagation Based On Device Chain ReductionAug 17, 16Feb 22, 18[G06F]
2018/0032,357 DEBUG ENVIRONMENT FOR A MULTI USER HARDWARE ASSISTED VERIFICATION SYSTEMJul 10, 17Feb 01, 18[G06F]
2018/0011,956 Data Injection In Emulation Without RebootingJul 11, 16Jan 11, 18[G06F]
2017/0315,603 POWER PROFILING FOR EMBEDDED SYSTEM DESIGNFeb 13, 17Nov 02, 17[G06F]
2017/0220,455 TEST CASE GENERATION USING A CONSTRAINT GRAPH SOLVERJan 29, 16Aug 03, 17[G06F]
2017/0220,729 Directed Self-Assembly-Aware Layout Decomposition For Multiple PatterningApr 13, 17Aug 03, 17[G06F]
2017/0213,043 SECURITY HARDENED CONTROLLER AREA NETWORK TRANSCEIVERJan 27, 16Jul 27, 17[G06F]

View all Publication..

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9915702 Channel sharing for testing circuits having non-identical coresNov 26, 14Mar 13, 18[G01R]
9910943 Distributed state and data functional coverageJan 31, 14Mar 06, 18[G06F]
9898388 Non-intrusive software verificationMay 26, 15Feb 20, 18[G06F]
9898562 Distributed state and data functional coverageJan 30, 14Feb 20, 18[G06F]
9898563 Modeling memory in emulation based on cacheNov 13, 15Feb 20, 18[G06F]
9886178 User interfacesMar 14, 14Feb 06, 18[G06T, G06F]
9887884 Cloud services platformMar 17, 14Feb 06, 18[H04L, H04N, G06Q, G06F]
9881113 Layout synthesis of a three-dimensional mechanical system designJun 17, 15Jan 30, 18[G06F]
9874606 Selective per-cycle masking of scan chains for system level testJun 21, 16Jan 23, 18[G06F, G01R]
9857421 Dynamic design partitioning for diagnosisMay 04, 16Jan 02, 18[G06F, G01R]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0132,434 MEASURE VARIATION TOLERANT PHYSICAL UNCLONABLE FUNCTION DEVICEAbandonedNov 24, 15May 11, 17[G06F]
2016/0140,278 Modeling Photoresist Shrinkage Effects In LithographyAbandonedJan 25, 16May 19, 16[G06F]
2015/0252,932 MULTI-PART, TAPERED, CONCENTRIC MANIFOLD AND METHOD OF MAKING THE MANIFOLDAbandonedMay 19, 15Sep 10, 15[F16L]
9009643 Density-based integrated circuit design adjustmentWithdrawnAug 19, 13Apr 14, 15[G06F]
8984460 Defect injection for transistor-level fault simulationWithdrawnAug 22, 13Mar 17, 15[G06F]
2015/0067,621 Logic-Driven Layout Pattern AnalysisAbandonedSep 05, 13Mar 05, 15[G06F]
2014/0337,810 MODULAR PLATFORM FOR INTEGRATED CIRCUIT DESIGN ANALYSIS AND VERIFICATIONAbandonedDec 16, 13Nov 13, 14[G06F]
2014/0330,529 IDENTIFICATION OF FLUID FLOW BOTTLENECKSAbandonedMar 26, 14Nov 06, 14[G01F]
2014/0313,542 CLOUD SERVICES PLATFORMAbandonedMar 17, 14Oct 23, 14[G06F]
2014/0246,705 Programmable Leakage Test For Interconnects In Stacked DesignsAbandonedMar 03, 14Sep 04, 14[G06F]
2014/0212,793 Multiresolution Mask WritingAbandonedAug 14, 13Jul 31, 14[G03F]
2014/0201,694 Wrap Based Fill In Layout DesignsAbandonedJan 15, 14Jul 17, 14[G06F]
2014/0040,848 Controllable Turn-Around Time For Post Tape-Out FlowAbandonedFeb 14, 13Feb 06, 14[G06F]
2014/0040,850 ManufacturabilityAbandonedJan 22, 13Feb 06, 14[G06F]
8631362 Circuit instance variation probability system and methodExpiredFeb 25, 13Jan 14, 14[G06F]
2013/0318,487 Programmable Circuit Characteristics AnalysisAbandonedMay 23, 13Nov 28, 13[G06F]
2013/0318,531 Domain Bounding For Symmetric Multiprocessing SystemsAbandonedFeb 19, 13Nov 28, 13[G06F]
2013/0305,111 Circuit And Method For Simultaneously Measuring Multiple Changes In DelayAbandonedJul 15, 13Nov 14, 13[G01R]
2013/0263,074 Analog Rule Check WaiverAbandonedMay 23, 13Oct 03, 13[G06F]
2013/0254,581 Power Profiling For Embedded System DesignAbandonedMay 15, 13Sep 26, 13[G06F]

View all patents..

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.