Micro-Probe, Inc.

Patent Owner

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7091729 Cantilever probe with dual plane fixture and probe apparatus therewithJul 09, 04Aug 15, 06[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
4837622 High density probe cardExpiredJun 22, 88Jun 06, 89[G01R]
4757256 High density probe cardExpiredMay 01, 87Jul 12, 88[G01R]

Top Inventors for This Owner

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