MICRON SEMICONDUCTOR, INC.

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Technologies

Intl Class Technology # of Patents Rank
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 13244
 
 
 
G11C STATIC STORES 9120
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3297
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 268
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2126
 
 
 
H03K PULSE TECHNIQUE 2104
 
 
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 148
 
 
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 140
 
 
 
C03C CHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS138
 
 
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 162

Top Patents (by citation)

Patent # Title Filing Date Issue Date Intl Class Cited #
5,408,190 Testing apparatus having substrate interconnect for discrete die burn-in for nonpackaged dieJun 07, 93Apr 18, 95[G01R]174
5,341,016 Low resistance device element and interconnection structureJun 16, 93Aug 23, 94[H01L]144
5,419,807 Method of providing electrical interconnect between two layers within a silicon substrate, semiconductor apparatus, and method of forming apparatus for testing semiconductor circuitry for operabilityApr 06, 94May 30, 95[H01L]114
5,187,638 Barrier layers for ferroelectric and pzt dielectric on siliconJul 27, 92Feb 16, 93[H01G, H01L]112
5,506,814 Video random access memory device and method implementing independent two WE nibble controlMay 28, 93Apr 09, 96[G11C]98
5,395,801 Chemical-mechanical polishing processes of planarizing insulating layersSep 29, 93Mar 07, 95[H01L]92
5,479,416 Apparatus and method for error detection and correction in radio frequency identification deviceSep 30, 93Dec 26, 95[G06F]82
5,349,566 Memory device with pulse circuit for timing data output, and method for outputting dataMay 19, 93Sep 20, 94[G11C]80
5,235,550 Method for maintaining optimum biasing voltage and standby current levels in a DRAM array having repaired row-to-column shortsMay 16, 91Aug 10, 93[G11C]78
5,262,998 Dynamic random access memory with operational sleep modeAug 14, 91Nov 16, 93[G11C]69

Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6,560,669 Double data rate synchronous memory with block-writeMay 18, 99May 06, 03[G06F]
6,535,413 Method of selectively forming local interconnects using design rulesAug 31, 00Mar 18, 03[H01L]
6,312,557 Method and apparatus for using photoemission to determine the endpoint of an etch processOct 05, 00Nov 06, 01[C23F]
6,244,498 Ultrasonic vibration mode for wire bondingApr 16, 99Jun 12, 01[B23K]
6,143,667 Method and apparatus for using photoemission to determine the endpoint of an etch processJun 28, 99Nov 07, 00[H01L]
5,896,551 Initializing and reprogramming circuitry for state independent memory array burst operations controlApr 15, 94Apr 20, 99[G06F]
5,514,246 Plasma reactors and method of cleaning a plasma reactorJun 02, 94May 07, 96[H05H]
5,506,814 Video random access memory device and method implementing independent two WE nibble controlMay 28, 93Apr 09, 96[G11C]
5,498,570 Method of reducing overetch during the formation of a semiconductor deviceSep 15, 94Mar 12, 96[H01L]
5,479,694 Method for mounting integrated circuits onto printed circuit boards and testingApr 13, 93Jan 02, 96[G01R, B23P, B23K, H05K]

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Top Inventors for This Owner

Inventor Name Address # of Patent/Pub
Chern Wen-Foo
Boise, ID
4
Sandhu Gurtej S
Boise, ID
4
Blodgett Greg A
Boise, ID
3
Cathey David A
Boise, ID
3
Douglas Kurt P
Boise, ID
3
Lowrey Tyler A
Boise, ID
3
Doan Trung T
Boise, ID
2
Jiang Tongbi
Boise, ID
2