MICRON SEMICONDUCTOR, INC.
Patent Owner
Stats
- 36 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- May 06, 2003 most recent publication
Details
- 36 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 2,823 Total Citation Count
- Sep 18, 1972 Earliest Filing
- 19 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
6535413 Method of selectively forming local interconnects using design rulesAug 31, 00Mar 18, 03[H01L]
6312557 Method and apparatus for using photoemission to determine the endpoint of an etch processOct 05, 00Nov 06, 01[C23F]
6143667 Method and apparatus for using photoemission to determine the endpoint of an etch processJun 28, 99Nov 07, 00[H01L]
5896551 Initializing and reprogramming circuitry for state independent memory array burst operations controlApr 15, 94Apr 20, 99[G06F]
5506814 Video random access memory device and method implementing independent two WE nibble controlMay 28, 93Apr 09, 96[G11C]
5498570 Method of reducing overetch during the formation of a semiconductor deviceSep 15, 94Mar 12, 96[H01L]
5479694 Method for mounting integrated circuits onto printed circuit boards and testingApr 13, 93Jan 02, 96[B23P, B23K, G01R, H05K]
5478399 Unitary wafer plasma enhanced chemical vapor deposition holding deviceDec 03, 93Dec 26, 95[C23C]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
6164993 Zero insertion force sockets using negative thermal expansion materialsExpiredFeb 12, 99Dec 26, 00[H01R]
5422447 Keyboard with full-travel, self-leveling keyswitches and return mechanism keyswitchExpiredApr 14, 94Jun 06, 95[B41J, H01H]
5069747 Creation and removal of temporary silicon dioxide structures on an in-process integrated circuit with minimal effect on exposed, permanent silicon dioxide structuresExpiredDec 21, 90Dec 03, 91[C03C, B44C]
5032545 Process for preventing a native oxide from forming on the surface of a semiconductor material and integrated circuit capacitors produced therebyExpiredOct 30, 90Jul 16, 91[H01L]
5013398 Anisotropic etch method for a sandwich structureExpiredMay 29, 90May 07, 91[H01L, C03C, C23F, B44C]
4992137 Dry etching method and method for prevention of low temperature post etch depositExpiredJul 18, 90Feb 12, 91[C03C, B44C]
4962326 Reduced latchup in precharging I/O lines to sense amp signal levelsExpiredJul 22, 88Oct 09, 90[H03K]
4859304 Temperature controlled anode for plasma dry etchers for etching semiconductorExpiredJul 18, 88Aug 22, 89[C23C, B01J]
4660282 Method and apparatus for unloading electronic circuit packages from zero insertion force socketsExpiredDec 16, 85Apr 28, 87[B23P, H05K]
4389255 Method of forming buried collector for bipolar transistor in a semiconductor by selective implantation of poly-si followed by oxidation and etch-offExpiredNov 13, 80Jun 21, 83[H01L]
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