MICRONIC LASER SYSTEMS AB
Patent Owner
Stats
- 106 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Nov 18, 2014 most recent publication
Details
- 106 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 3,854 Total Citation Count
- Jan 08, 1993 Earliest Filing
- 49 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
8861066 Oversized micro-mechanical light modulator with redundant elements, device and methodFeb 16, 10Oct 14, 14[B41J, G02B, G02F]
8755590 Method and device using rotating printing arm to project or view image across a workpieceMay 13, 13Jun 17, 14[G06K]
8537416 Rotor optics imaging method and system with variable dose during sweepMar 05, 10Sep 17, 13[G06F]
8539395 Method and apparatus for merging multiple geometrical pixel images and generating a single modulator pixel imageMar 02, 11Sep 17, 13[G06F, G03F]
8531755 SLM device and method combining multiple mirrors for high-power deliveryFeb 16, 10Sep 10, 13[G02B, G02F]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
8466945 Methods and device for laser processingWithdrawnMar 02, 11Jun 18, 13[B41J, B23K, G02B, G03F]
2011/0216,302 ILLUMINATION METHODS AND DEVICES FOR PARTIALLY COHERENT ILLUMINATIONAbandonedMar 05, 10Sep 08, 11[G02B, G03B]
2010/0265,557 Optical Systems Configured to Generate More Closely Spaced Light Beams and Pattern Generators Including the SameAbandonedApr 21, 10Oct 21, 10[F21V, G02F]
2010/0142,022 Methods and apparatuses for increasing available power in optical systemsAbandonedDec 04, 09Jun 10, 10[G02B]
2010/0142,838 GRADIENT ASSISTED IMAGE RESAMPLING IN MICRO-LITHOGRAPHIC PRINTINGAbandonedDec 04, 09Jun 10, 10[G06K]
2010/0020,331 Laser interferometer systems and methods with suppressed error and pattern generators having the sameAbandonedJul 25, 08Jan 28, 10[G01B]
2009/0234,611 Method For Measuring The Position Of A Mark In A Micro Lithographic Deflector SystemAbandonedApr 25, 05Sep 17, 09[G06F]
7588870 Dual layer workpiece masking and manufacturing processExpiredJan 29, 08Sep 15, 09[G03C, G03F]
2009/0199,152 Methods and apparatuses for reducing mura effects in generated patternsAbandonedFeb 06, 08Aug 06, 09[G21G, G06F, G03F]
2009/0175,530 Methods and apparatuses for detecting pattern errorsAbandonedNov 12, 08Jul 09, 09[H04N, G06K]
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