MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS891
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7687767 Fast scanning stage for a scanning probe microscopeDec 02, 03Mar 30, 10[G02B]
6952952 Topography and recognition imaging atomic force microscope and method of operationOct 30, 03Oct 11, 05[G01B]
6748795 Pendulum scanner for scanning probe microscopeJul 26, 02Jun 15, 04[G01N, G01B]
6245204 Vibrating tip conducting probe microscopeMar 23, 99Jun 12, 01[G01N, G01B]
6134955 Magnetic modulation of force sensor for AC detection in an atomic force microscopeJan 11, 99Oct 24, 00[G01B]
6121611 Force sensing probe for scanning probe microscopyMay 20, 98Sep 19, 00[G01B]
6051825 Conducting scanning probe microscope with environmental controlJun 19, 98Apr 18, 00[G01J]
5983712 Microscope for compliance measurementAug 04, 97Nov 16, 99[G01B]
5821545 Heated stage for a scanning probe microscopeOct 11, 96Oct 13, 98[H01J]
5805448 Hybrid control system for scanning probe microscopesFeb 21, 97Sep 08, 98[G01N, G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6734438 Scanning probe microscope and solenoid driven cantilever assemblyExpiredJun 14, 01May 11, 04[H01J]
6017590 Tip coating system for scanning probe microscopyExpiredDec 05, 96Jan 25, 00[B05D]

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