NAWOTEC GMBH

Patent Owner

Watch Compare Add to Portfolio

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
 
 
B44C PRODUCING DECORATIVE EFFECTS 133
 
 
 
C23F NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES 135
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
 
 
G01V GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 179
 
 
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 1132
 
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103
 
 
 
G09G ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION 1150

Top Patents (by citation)

Upgrade to the Professional Level to View Top Patents for this Owner. Learn More

Recent Publications

  • No Recent Publications to Display

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7537708 Procedure for etching of materials at the surface with focussed electron beam induced chemical reactions at said surfaceJul 02, 07May 26, 09[B44C]
7238294 Procedure for etching of materials at the surface with focussed electron beam induced chemical reactions at said surfaceMay 02, 03Jul 03, 07[C23F]
7232997 Apparatus and method for investigating or modifying a surface with a beam of charged particlesApr 14, 05Jun 19, 07[G01N]
6528807 Method for applying or removing materialFeb 04, 00Mar 04, 03[H01J]
6504143 Device for inputting dataSep 10, 99Jan 07, 03[H01J]
6426499 Multi-probe test head and process using sameSep 30, 99Jul 30, 02[H01J, G01R, G01B]
6366278 Camera systemNov 17, 99Apr 02, 02[G09G]
6291139 Process for fabricating three-dimensional polymer layer structuresJul 09, 98Sep 18, 01[G03F]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6967714 Method for determining a refractive indexExpiredMar 24, 01Nov 22, 05[G01N]
6909104 Miniaturized terahertz radiation sourceExpiredMay 10, 00Jun 21, 05[G02F]
6903549 Electron spectrometerExpiredAug 08, 01Jun 07, 05[G01V]
2005/0103,272 Material processing system and methodAbandonedAug 24, 04May 19, 05[C23C]
2004/0173,759 Device, set and method for carrying a gas or a liquid to a surface through a tubeAbandonedJun 27, 03Sep 09, 04[G01N]
6232046 Process for improving the contrast in the structure of 3-dimensional surfacesExpiredSep 22, 98May 15, 01[G03F]

Top Inventors for This Owner

Upgrade to the Professional Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.