NEC ELECTRONICS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
 
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 199
 
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127
 
 
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 1110
 
 
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6327642 Parallel access virtual channel memory systemNov 10, 99Dec 04, 01[G06F]
6154017 Temperature/voltage compensation circuitJun 18, 98Nov 28, 00[G05F]
5606428 Image compression systems with optimized data accessJun 16, 94Feb 25, 97[H04N]
5471635 Methods and apparatus pulse-width modulation that use a counter and a modulus deviceMay 31, 94Nov 28, 95[G06F]
5463394 Current switch for a high speed DACJun 15, 94Oct 31, 95[H03M]
5438238 Multiple filament enhanced ion sourceMar 19, 93Aug 01, 95[H01J]
5377346 Methods and apparatus for pulse-width modulation that use a counter and a modulus deviceJun 06, 90Dec 27, 94[G06F]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6782502 Combinational test pattern generation method and apparatusExpiredOct 01, 02Aug 24, 04[G06F, G01R]
6742106 Vector transfer system generating address error exception when vector to be transferred does not start and end on same memory pageExpiredJan 28, 03May 25, 04[G06F]
6655898 Front opening unified pod (FOUP) hoist jigExpiredDec 11, 01Dec 02, 03[B65G]
6582137 Polyimide coating process with dilute TMAH and DI-water backrinseExpiredJul 18, 00Jun 24, 03[G03D]
6517908 Method for making a test wafer from a substrateExpiredJan 10, 00Feb 11, 03[C23C]
6487705 Timing optimization and timing closure for integrated circuit modelsExpiredSep 05, 01Nov 26, 02[G06F]
2002/0148,851 SDS gas bottle thermo pressurizerAbandonedApr 12, 01Oct 17, 02[B67D]
6467077 Capturing an evolving wafer fabrication method and systemExpiredJul 14, 99Oct 15, 02[G06F]
2002/0073,426 Efficiently storing electronic program guideAbandonedDec 08, 00Jun 13, 02[H04N, G06F]
6216051 Manufacturing backup systemExpiredMay 04, 98Apr 10, 01[G05B, G06F, H02H]
6211009 Manufacturing a capacitor electrode in a semiconductor deviceExpiredSep 16, 99Apr 03, 01[H01L]
5911149 Apparatus and method for implementing a programmable shared memory with dual bus architectureExpiredNov 01, 96Jun 08, 99[G06F]
5666322 Phase-locked loop timing controller in an integrated circuit memoryExpiredSep 21, 95Sep 09, 97[G11C]
5529626 Spincup with a wafer backside deposition reduction apparatusExpiredOct 24, 94Jun 25, 96[B05C]
5509539 Method for preparing injection molding compound pellets to remove molding compound dust and broken pelletsExpiredDec 21, 93Apr 23, 96[B07C]
5463311 Apparatus and method for measuring operating voltage electrical signals in a high voltage environmentExpiredDec 21, 93Oct 31, 95[G01R]
5354716 Method for forming a DRAM memory cell with tapered capacitor electrodesExpiredJul 10, 91Oct 11, 94[H01L]
5093702 Method of alignment for semiconductor memory deviceExpiredNov 28, 88Mar 03, 92[H01L]
5068707 DRAM memory cell with tapered capacitor electrodesExpiredMay 02, 90Nov 26, 91[H01L]
5065101 Mini-relay or reed relay testerExpiredMar 07, 90Nov 12, 91[G01R]

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