NGR INC.

Patent Owner

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9 total patents issued
11 Total Apps Published
Apr 16, 2013 most recent publication

Details

9 Issued Patents
7 Issued in last 3 years
6 Published in last 3 years

186 Total Citation Count
Aug 25, 2000 Earliest Filing
0 Expired/Abandoned/Withdrawn Patents

Technologies

G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 9132

Subclasses

Top Owners

Top Patents (by citation)

6,868,175 Pattern inspection apparatus, pattern inspection method, and recording mediumAug 25, 00Mar 15, 05[G06K]53

7,796,801 Pattern inspection apparatus and methodMay 17, 06Sep 14, 10[G06K]12

7,817,844 Pattern inspection apparatus and methodFeb 16, 05Oct 19, 10[G06K]10

7,660,455 Pattern inspection apparatus, pattern inspection method, and recording mediumJan 28, 05Feb 09, 10[G06K]3

7,983,471 Pattern inspection apparatus and methodDec 04, 07Jul 19, 11[G06K]1

Recent Publications

2012/0328,181 PATTERN INSPECTION APPARATUS AND METHODSep 05, 12Dec 27, 12[G06K]

2012/0117,520 Systems And Methods For Inspecting And Controlling Integrated Circuit Fabrication Using A Calibrated Lithography SimulatorNov 07, 11May 10, 12[G06F]

2011/0235,895 PATTERN INSPECTION APPARATUS AND METHODJun 02, 11Sep 29, 11[G06K]

2010/0303,334 PATTERN INSPECTION APPARATUS AND METHODAug 06, 10Dec 02, 10[G06K]

2010/0215,247 System And Method For A Semiconductor Lithographic Process Control Using Statistical Information In Defect IdentificationMar 16, 10Aug 26, 10[G06K]

2010/0158,345 Defect And Critical Dimension Analysis Systems And Methods For A Semiconductor Lithographic ProcessDec 14, 09Jun 24, 10[G06K]

2008/0130,982 Pattern inspection apparatus and methodDec 04, 07Jun 05, 08[G06K]

2006/0245,636 Pattern inspection apparatus and methodMay 17, 06Nov 02, 06[G06K]

2005/0226,494 Pattern inspection apparatus, pattern inspection method, and recording mediumJan 28, 05Oct 13, 05[G06K]

2005/0146,714 Pattern inspection apparatus and methodFeb 16, 05Jul 07, 05[G01B, G01N]

View all Publication..

Recent Patents

8,422,761 Defect and critical dimension analysis systems and methods for a semiconductor lithographic processDec 14, 09Apr 16, 13[G06K]

8,285,031 Pattern inspection apparatus and methodJun 02, 11Oct 09, 12[G06K]

8,150,140 System and method for a semiconductor lithographic process control using statistical information in defect identificationMar 16, 10Apr 03, 12[G06K]

8,045,785 Pattern inspection apparatus and methodAug 06, 10Oct 25, 11[G06K]

7,983,471 Pattern inspection apparatus and methodDec 04, 07Jul 19, 11[G06K]

7,817,844 Pattern inspection apparatus and methodFeb 16, 05Oct 19, 10[G06K]

7,796,801 Pattern inspection apparatus and methodMay 17, 06Sep 14, 10[G06K]

7,660,455 Pattern inspection apparatus, pattern inspection method, and recording mediumJan 28, 05Feb 09, 10[G06K]

6,868,175 Pattern inspection apparatus, pattern inspection method, and recording mediumAug 25, 00Mar 15, 05[G06K]