NGR INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 12186
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 2133
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2126

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0372,464 PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUSJun 28, 16Dec 28, 17[G06T, G06K]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9793091 Image generation apparatusJun 28, 16Oct 17, 17[H01J]
9189843 Pattern inspection apparatus and methodSep 05, 12Nov 17, 15[G06T, G06K]
8422761 Defect and critical dimension analysis systems and methods for a semiconductor lithographic processDec 14, 09Apr 16, 13[G06K]
8285031 Pattern inspection apparatus and methodJun 02, 11Oct 09, 12[G06K]
8150140 System and method for a semiconductor lithographic process control using statistical information in defect identificationMar 16, 10Apr 03, 12[G06K]
8045785 Pattern inspection apparatus and methodAug 06, 10Oct 25, 11[G06K]
7983471 Pattern inspection apparatus and methodDec 04, 07Jul 19, 11[G06K]
7817844 Pattern inspection apparatus and methodFeb 16, 05Oct 19, 10[G06K]
7796801 Pattern inspection apparatus and methodMay 17, 06Sep 14, 10[G06K]
7660455 Pattern inspection apparatus, pattern inspection method, and recording mediumJan 28, 05Feb 09, 10[G06K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2018/0005,797 SCANNING ELECTRON MICROSCOPEAbandonedJun 29, 16Jan 04, 18[H01J]
2012/0117,520 Systems And Methods For Inspecting And Controlling Integrated Circuit Fabrication Using A Calibrated Lithography SimulatorAbandonedNov 07, 11May 10, 12[G06F]
2004/0081,350 Pattern inspection apparatus and methodAbandonedOct 21, 03Apr 29, 04[G06K]

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