Nihon Denshizairyo Kabushiki Kaisha

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 4155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7307435 Probe cardSep 20, 05Dec 11, 07[G01R]
6300783 Probe, manufacture of same, and vertically operative type probe card assembly employing sameSep 04, 98Oct 09, 01[G01R]
6294922 Probe for testing a semiconductor integrated circuitDec 23, 96Sep 25, 01[G01R]
D424539 Ring for probe cardOct 13, 98May 09, 00[1402]
D424043 Ring for probe cardOct 13, 98May 02, 00[1402]
D420659 Ring for probe cardOct 13, 98Feb 15, 00[1402]
5670889 Probe card for maintaining the position of a probe in high temperature applicationMar 15, 95Sep 23, 97[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7268568 Probe cardExpiredSep 13, 05Sep 11, 07[G01R]
7208964 Probe cardExpiredMay 05, 04Apr 24, 07[G01R]
7075319 Probe card having a coil spring interposed between a support member and a contactor unitExpiredJul 21, 03Jul 11, 06[G01R]
6980013 Probe cardExpiredAug 17, 04Dec 27, 05[G01R]
2005/0184,743 Probe cardAbandonedFeb 14, 05Aug 25, 05[G01R]
2005/0184,745 Probe cardAbandonedFeb 22, 05Aug 25, 05[G01R]
2005/0099,195 PROBE SHEET AND PROBE SHEET UNIT USING SAMEAbandonedMay 18, 04May 12, 05[G01R]
6853208 Vertical probe cardExpiredMay 10, 01Feb 08, 05[G01R]
6836024 Apparatus for connecting between substratesExpiredMay 07, 03Dec 28, 04[H01L]
2002/0028,641 PROBE END CLEANING SHEETAbandonedFeb 16, 99Mar 07, 02[B24B]
5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintainedExpiredJul 24, 91Jul 28, 92[G01R]
5055778 Probe card in which contact pressure and relative position of each probe end are correctly maintainedExpiredJul 05, 90Oct 08, 91[G01R]
4774413 Ion emmissive head and ion beam irradiation device incorporating the sameExpiredOct 16, 86Sep 27, 88[H01J]
4638217 Fused metal ion source with sintered metal headExpiredMar 18, 83Jan 20, 87[H01J, H05B]
4567433 Complex probe card for testing a semiconductor waferExpiredMay 23, 84Jan 28, 86[G01R]

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