NIRECO CORPORATION
Patent Owner
Stats
- 11 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Nov 14, 2017 most recent publication
Details
- 11 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 282 Total Citation Count
- Mar 25, 1985 Earliest Filing
- 24 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9816851 Eddy current mold level measuring device and mold level measuring methodJul 27, 15Nov 14, 17[B22D, G01F]
9322696 Apparatus for measuring level of molten metal and method for measuring level of molten metalDec 09, 13Apr 26, 16[B22D, G01F]
8878717 Projection detecting apparatus and projection detecting methodSep 15, 10Nov 04, 14[G01S, G01B]
8736851 Film thickness measuring device and film thickness measuring methodSep 25, 13May 27, 14[G01B]
7659729 Method and device for measuring width direction end position of stripe body, and method and device for measuring width direction center position of stripe bodySep 12, 05Feb 09, 10[G01R]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2013/0300,598 APPARATUS FOR MEASURING WIDTH DIRECTION END POSITION OF STRIP, APPARATUS FOR MEASURING WIDTH DIRECTION CENTRAL POSITION OF STRIP AND MICROWAVE SCATTERING PLATEAbandonedJul 17, 13Nov 14, 13[G01S]
8361378 Immersion nozzle used for measuring level of molten metal and apparatus for measuring level of molten metalExpiredJan 03, 12Jan 29, 13[C21D]
2013/0021,472 APPARATUS FOR DETECTING END OF STRIP AND METHOD OF DOING THE SAMEAbandonedJul 21, 11Jan 24, 13[H04N]
8339617 Film thickness measuring device and film thickness measuring methodExpiredOct 14, 10Dec 25, 12[G01N, G01B]
6831875 Apparatus for ultrasonically detecting position of web edge and method of doing the sameExpiredOct 20, 03Dec 14, 04[G01S, G01B]
6281499 Method for analyzing measured value by on-line spectral analyzerExpiredApr 28, 99Aug 28, 01[G01N]
5583828 Method and apparatus for detection of edge position thickness or splice position of a material webExpiredMar 31, 95Dec 10, 96[B23Q, G01B]
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