National Institute of Metrology

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G03B APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR 196
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9347823 Absolute measurement method and apparatus thereof for non-linear errorJan 28, 14May 24, 16[G01J]
9323158 Method of extreme ultraviolet lithography projection objectiveFeb 28, 12Apr 26, 16[G02B, G03B, G03F]
7742244 Cylindrical model eye, cylindrical test device and the manufacturing method thereofOct 31, 08Jun 22, 10[G02B, A61B]

Expired/Abandoned/Withdrawn Patents

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