OLYMPUS NDT INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 17189
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS693
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 4443
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR265
 
  
 
G09G ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION 2149
 
  
 
1004 OTHER MEASURING INSTRUMENTS, APPARATUS AND DEVICES234
 
  
 
G08B SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS 193
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 1110
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9476859 Automatic calibration for phased array inspection of girth weldDec 16, 13Oct 25, 16[G01N]
9350985 Method and circuitry for removing circling drifts in NDT/NDI measurement displaySep 25, 13May 24, 16[H04N, G01N]
9316618 Method for monitoring the integrity of an eddy current inspection channelMar 26, 14Apr 19, 16[G01N, G01R]
9243883 Apparatus and method for conducting and real-time application of EC probe calibrationMar 27, 14Jan 26, 16[G01N, G01R, G01B]
9182212 Hall effect probe with exchangeable wear tipsNov 07, 12Nov 10, 15[H01L, G01B]
9182363 Instrument and method of measuring the concentration of a target element in a multi-layer thin coatingNov 14, 13Nov 10, 15[G01N]
9176080 X-ray analysis apparatus with detector window protection featureJul 17, 12Nov 03, 15[G01N]
9110036 Assembly with a universal manipulator for inspecting dovetail of different sizesJul 31, 13Aug 18, 15[G01N]
9080951 Method and system of using 1.5D phased array probe for cylindrical parts inspectionMar 29, 13Jul 14, 15[G01N]
9081490 Apparatus and method for overlaying touch-screen input with digital display of an NDT/NDI instrumentJun 15, 12Jul 14, 15[G09G, G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0088,921 NON-DESTRUCTIVE TESTING INSTRUMENT WITH DISPLAY FEATURES INDICATING SIGNAL SATURATIONAbandonedSep 24, 13Mar 27, 14[G01D]
2013/0249,540 EDDY CURRENT ARRAY PROBE AND METHOD FOR LIFT-OFF COMPENSATION DURING OPERATION WITHOUT KNOWN LIFT REFERENCESAbandonedMar 22, 12Sep 26, 13[G01N]
2013/0060,488 IMAGE PROCESSING SYSTEM AND METHOD FOR NDT/NDI TESTING DEVICESAbandonedSep 02, 11Mar 07, 13[G06F]
2012/0236,989 Portable XRF analyzer for low atomic number elementsAbandonedMar 16, 11Sep 20, 12[G01N]
2012/0006,132 PROBE HOLDER ADJUSTABLE TO CONFORM TO TEST SURFACESAbandonedJul 09, 10Jan 12, 12[G01D]
2011/0234,212 MAGNETIC FLUX LEAKAGE INSPECTION DEVICEAbandonedMar 29, 10Sep 29, 11[G01N]
2011/0188,962 SELF-ALIGNING FASTENER ASSEMBLYAbandonedFeb 01, 10Aug 04, 11[F16B]
2010/0104,132 COMPUTER IMAGE PROCESSING SYSTEM AND METHOD FOR NDT/NDI TESTING DEVICESAbandonedOct 26, 09Apr 29, 10[G09G, G06K]

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