OMNIPROBE, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 12194
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 8120
 
  
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 398
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 343
 
  
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 291
 
  
 
G01F MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 257
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
G21G CONVERSION OF CHEMICAL ELEMENTS; RADIOACTIVE SOURCES 215
 
  
 
A61N ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY 1106
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0189,929 RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLINGOct 29, 15Jun 30, 16[H01J]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
RE46350 Method for stem sample inspection in a charged particle beam instrumentApr 22, 14Mar 28, 17[G01N]
9349573 Total release method for sample extraction in an energetic-beam instrumentJul 11, 15May 24, 16[H01J, G01N]
9097625 Gas injection system for energetic-beam instrumentsApr 17, 13Aug 04, 15[C23C, H01J, G01N]
8759765 Method for processing samples held by a nanomanipulatorAug 06, 12Jun 24, 14[G21K, G01N]
8512474 Apparatus for precursor delivery system for irradiation beam instrumentsJan 25, 12Aug 20, 13[C23C, B05C]
8513622 Method for extracting frozen specimens and manufacture of specimen assembliesApr 04, 12Aug 20, 13[G01N, B01L]
8440969 Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam imagesAug 02, 11May 14, 13[H01J]
8394454 Method and apparatus for precursor delivery system for irradiation beam instrumentsMar 06, 09Mar 12, 13[C23C]
8288740 Method for preparing specimens for atom probe analysis and specimen assemblies made therebyJun 27, 08Oct 16, 12[G01D]
8247768 Method for stem sample inspection in a charged particle beam instrumentOct 01, 10Aug 21, 12[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0204,226 APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENTAbandonedMay 04, 11Aug 25, 11[G01N]
2011/0017,922 VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUMENTSAbandonedJul 24, 09Jan 27, 11[G21K]
2010/0200,546 METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGYAbandonedFeb 11, 10Aug 12, 10[B44C]
2010/0068,408 METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENERGETIC-BEAM MICROSCOPESAbandonedSep 16, 08Mar 18, 10[C23C]
2010/0025,580 GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENTAbandonedJul 31, 09Feb 04, 10[H01J]
7446542 Apparatus and method for automated stress testing of flip-chip packagesExpiredMar 03, 06Nov 04, 08[G01R]
7126132 Apparatus for preparing a TEM sample holderExpiredJan 19, 06Oct 24, 06[G01F]
7126133 Kit for preparing a tem sample holderExpiredJan 19, 06Oct 24, 06[G01F]
2006/0219,919 TEM sample holder and method of forming sameAbandonedMay 12, 06Oct 05, 06[G21K, G01N]
2006/0022,136 Multiple gas injection system for charged particle beam instrumentsAbandonedJul 21, 05Feb 02, 06[G21K]

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