OMNIPROBE, INC.
Patent Owner
Stats
- 31 US PATENTS IN FORCE
- 1 US APPLICATIONS PENDING
- Mar 28, 2017 most recent publication
Details
- 31 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 595 Total Citation Count
- May 23, 2001 Earliest Filing
- 10 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2016/0189,929 RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLINGOct 29, 15Jun 30, 16[H01J]
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
RE46350 Method for stem sample inspection in a charged particle beam instrumentApr 22, 14Mar 28, 17[G01N]
9349573 Total release method for sample extraction in an energetic-beam instrumentJul 11, 15May 24, 16[H01J, G01N]
8512474 Apparatus for precursor delivery system for irradiation beam instrumentsJan 25, 12Aug 20, 13[C23C, B05C]
8513622 Method for extracting frozen specimens and manufacture of specimen assembliesApr 04, 12Aug 20, 13[G01N, B01L]
8440969 Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam imagesAug 02, 11May 14, 13[H01J]
8394454 Method and apparatus for precursor delivery system for irradiation beam instrumentsMar 06, 09Mar 12, 13[C23C]
8288740 Method for preparing specimens for atom probe analysis and specimen assemblies made therebyJun 27, 08Oct 16, 12[G01D]
8247768 Method for stem sample inspection in a charged particle beam instrumentOct 01, 10Aug 21, 12[G01N]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2011/0204,226 APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRUMENTAbandonedMay 04, 11Aug 25, 11[G01N]
2011/0017,922 VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUMENTSAbandonedJul 24, 09Jan 27, 11[G21K]
2010/0200,546 METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGYAbandonedFeb 11, 10Aug 12, 10[B44C]
2010/0068,408 METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENERGETIC-BEAM MICROSCOPESAbandonedSep 16, 08Mar 18, 10[C23C]
2010/0025,580 GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENTAbandonedJul 31, 09Feb 04, 10[H01J]
7446542 Apparatus and method for automated stress testing of flip-chip packagesExpiredMar 03, 06Nov 04, 08[G01R]
2006/0022,136 Multiple gas injection system for charged particle beam instrumentsAbandonedJul 21, 05Feb 02, 06[G21K]
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