OPTIMET, OPTICAL METROLOGY LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 192
 
 
 
G03B APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR 196
 
 
 
G03H HOLOGRAPHIC PROCESSES OR APPARATUS 131

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8118438 Method and apparatus for real-time projection onto an object of data obtained from 3-D measurementJul 24, 09Feb 21, 12[G03B]
7728989 Double-sided measurement of dental objects using an optical scannerJul 27, 07Jun 01, 10[G01B]
7375827 Digitization of undercut surfaces using non-contact sensorsJan 24, 05May 20, 08[G01B]
6667458 Spot size and distance characterization for a laser toolApr 19, 01Dec 23, 03[B23K]
6169634 Illumination techniques for overcoming speckle artifacts in metrology applicationsMay 14, 99Jan 02, 01[G02B]
5953137 Linear conoscopic holographyOct 01, 97Sep 14, 99[G02B, G03H]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2012/0236,135 Intraoral Occlusion Measurement and RegistrationAbandonedMar 13, 12Sep 20, 12[H04N]
8129703 Intraoral imaging system and method based on conoscopic holographyExpiredMar 11, 09Mar 06, 12[H01L, G01N, G03H]
2009/0254,299 Dental Prosthesis Fabrication Based on Local Digitization of a TemporaryAbandonedMar 19, 09Oct 08, 09[G01N, A61C]
6590654 Polarized illumination and detection for metrological applicationsExpiredFeb 16, 01Jul 08, 03[G01J]
6134013 Optical ball grid array inspection systemExpiredSep 08, 98Oct 17, 00[G01B]

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