OPTOMETRIX, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
5754298 Method and apparatus for imaging semiconductor device propertiesSep 05, 96May 19, 98[G01N]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2006/0049,839 DYNAMIC SIGNAL INJECTION MICROSCOPYAbandonedAug 17, 05Mar 09, 06[G01R]
2004/0160,653 Systems and methods for correcting for spherical aberration in a scanning imaging systemAbandonedJan 23, 04Aug 19, 04[G03F]
6181416 Schlieren method for imaging semiconductor device propertiesExpiredApr 14, 99Jan 30, 01[G01N]
5850255 Method and apparatus for imaging electric fieldsExpiredOct 18, 96Dec 15, 98[H04N]

Top Inventors for This Owner

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