Orfield Laboratories, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G05B CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 299
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8392025 Architectural dynamic control: intelligent environmental control and feedback system for architectural settings including officesNov 22, 10Mar 05, 13[G05B]
7840310 Architectural dynamic control: intelligent environmental control and feedback system for architectural settings including officesJan 30, 06Nov 23, 10[G05B, G06F]
D509317 Reflector housingJan 06, 03Sep 06, 05[0000]
5686987 Methods for assessing visual tasks to establish desirable lighting and viewing conditions for performance of tasks; apparatus; and, applicationsDec 29, 95Nov 11, 97[G01N]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7252413 Light fixture, reflector housing, and facility that includes a plurality of light fixturesExpiredAug 31, 04Aug 07, 07[F21V]
6991029 Architectural dynamic control: intelligent environmental control and feedback system for architectural settings including officesExpiredJun 06, 03Jan 31, 06[F25B]
6783262 Light fixture, reflector housing, and facility that includes a plurality of light fixturesExpiredJan 06, 03Aug 31, 04[F21V]
6417919 Methods for assessing visual tasks to establish desirable lighting and viewing conditions for performance of tasks, apparatus; and, applicationsExpiredNov 13, 00Jul 09, 02[G01N]
6147752 Methods for assessing visual tasks to establish desirable lighting and viewing conditions for performance of tasks; apparatus; and, applicationsExpiredNov 20, 98Nov 14, 00[G01N]
5841530 Industrial viewing station for inspection of defectsExpiredSep 24, 97Nov 24, 98[G01N]

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