OTSUKA ELECTRONICS CO., LTD.

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Technologies

Intl Class Technology # of Patents Rank
 
 
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1442
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 6132
 
 
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 4150
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS277
 
 
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 150
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1140

Top Patents (by citation)

Patent # Title Filing Date Issue Date Intl Class Cited #
6,879,395 Spectrum measuring instrumentDec 23, 02Apr 12, 05[G01J]9
5,430,540 Luminous flux measuring apparatus using an integrating hemisphere or an integrating quarter sphereNov 08, 93Jul 04, 95[G01J]6
6,628,389 Method and apparatus for measuring cell gap of VA liquid crystal panelMay 09, 01Sep 30, 03[G01B, G01J]4
7,176,464 Method of and apparatus for determining the amount of impurity in gasJul 15, 05Feb 13, 07[G01J]3
7,663,744 Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the sameOct 16, 08Feb 16, 10[G01J]2
7,394,483 Display evaluation method and apparatusMay 13, 05Jul 01, 08[H04N]2
7,283,222 Optical measuring deviceApr 20, 07Oct 16, 07[G01J]2
8,119,996 Quantum efficiency measurement apparatus and quantum efficiency measurement methodJan 20, 09Feb 21, 12[G01J]1
7,483,550 Method and system for evaluating moving image quality of displaysJun 02, 04Jan 27, 09[H04N, G06K]1
7,236,250 Dynamic light scattering measurement apparatus using phase modulation interference methodOct 20, 04Jun 26, 07[G01B]1

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2013/0038,883 OPTICAL CHARACTERISTIC MEASURING APPARATUS AND OPTICAL CHARACTERISTIC MEASURING METHODJul 13, 12Feb 14, 13[G01B]
2013/0033,698 FILM THICKNESS MEASUREMENT APPARATUSJun 29, 12Feb 07, 13[G01B]
2012/0229,803 SPECTRAL CHARACTERISTIC MEASUREMENT METHOD AND SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUSFeb 16, 12Sep 13, 12[G01J]
2012/0075,628 OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTIC MEASUREMENT METHOD SUITABLE FOR SPECTRUM MEASUREMENTNov 29, 11Mar 29, 12[G01J]
2012/0018,280 TRANSFERRED OBJECT ROTATING DEVICEJul 21, 11Jan 26, 12[B65G]
2012/0019,831 OPTICAL MEASUREMENT APPARATUSJul 21, 11Jan 26, 12[G01N]
2011/0235,036 OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBER COUPLERFeb 25, 11Sep 29, 11[G01J]
2011/0226,961 QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREMENT APPARATUS, AND INTEGRATORFeb 24, 11Sep 22, 11[G01J]
2011/0205,541 OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEGRATORFeb 16, 11Aug 25, 11[G01J]
2011/0155,926 QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEASUREMENT METHODJan 20, 09Jun 30, 11[G01N]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8,422,018 Optical measurement apparatus including hemispherical optical integratorFeb 16, 11Apr 16, 13[G01N]
8,415,639 Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integratorFeb 24, 11Apr 09, 13[G01J]
8,327,997 Transferred object rotating deviceJul 21, 11Dec 11, 12[B65G]
8,305,576 Apparatus and method for measuring total luminous fluxMay 13, 10Nov 06, 12[G01J]
8,169,607 Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurementOct 04, 09May 01, 12[G01J]
8,169,608 Optical characteristic measurement device and optical characteristic measurement method suitable for spectrum measurementNov 29, 11May 01, 12[G01J]
8,164,632 Method and apparatus for measuring moving picture response curveFeb 27, 07Apr 24, 12[H04N]
8,119,996 Quantum efficiency measurement apparatus and quantum efficiency measurement methodJan 20, 09Feb 21, 12[G01J]
7,847,819 Measurement system for evaluating moving image quality of displaysJun 06, 03Dec 07, 10[H04N, G01C]
7,847,935 Method and apparatus for gas concentration quantitative analysisMar 18, 08Dec 07, 10[G01J]

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Top Inventors for This Owner

Inventor Name Address # of Patent/Pub
OHKUBO Kazuaki
Not Provided
17
Oka Koichi
Otsu-shi, JP
14
Mizuguchi Tsutomu
Ritto-shi, JP
10
OKAWAUCHI Makoto
Ritto-shi, JP
8
Enami Yoshi
Shiga, JP
7
Osawa Yoshihiro
Moriyama-shi, JP
7
Sano Hiroyuki
Konan-shi, JP
6
NITTA Satoshi
Kameoka-shi, JP
5
Oshima Kosei
Not Provided
4
Shima Shiro
Not Provided
4