OXFORD INSTRUMENTS AFM INC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS2277
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]175
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES251
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G12B DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR16

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9696342 Quantitative measurements using multiple frequency atomic force microscopyMar 29, 16Jul 04, 17[B82Y, G01Q, G01B]
9689890 Fully digitally controller for cantilever-based instrumentsJan 06, 15Jun 27, 17[B82Y, G01Q]
9528859 Transducer assembly with digitally created signalsMay 01, 15Dec 27, 16[G01B, G01D]
9366693 Variable density scanningJun 30, 15Jun 14, 16[G01Q]
9297827 Quantitative measurements using multiple frequency atomic force microscopyOct 29, 12Mar 29, 16[B82Y, G01Q]
9069007 Multiple frequency atomic force microscopyMay 28, 13Jun 30, 15[B82Y, G01Q]
9063042 NanoindenterJun 12, 12Jun 23, 15[B82Y, G01N, G01Q]
9024623 Transducer assembly with digitally created signalsSep 18, 12May 05, 15[G01B, G01D]
8925376 Fully digitally controller for cantilever-based instrumentsJun 26, 12Jan 06, 15[B82Y, G01Q, G01B]
8677809 Thermal measurements using multiple frequency atomic force microscopyOct 21, 10Mar 25, 14[G01Q]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0026,846 Variable Density ScanningAbandonedJul 16, 13Jan 22, 15[G01Q]
2014/0041,084 Material Property Measurements Using Multiple Frequency Atomic Fore MicroscopyAbandonedOct 13, 13Feb 06, 14[G01Q]
7434445 Apparatus for determining cantilever parametersExpiredJun 26, 06Oct 14, 08[G01B]
6884981 Diffractive optical position detectorExpiredAug 23, 02Apr 26, 05[G02B]

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