PANALYTICAL B.V.
Patent Owner
Stats
- 60 US PATENTS IN FORCE
- 1 US APPLICATIONS PENDING
- Mar 06, 2018 most recent publication
Details
- 60 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 1,268 Total Citation Count
- May 23, 1984 Earliest Filing
- 24 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2013/0220,971 METHOD FOR MANUFACTURING A MULTILAYER STRUCTURE WITH A LATERAL PATTERN FOR APPLICATION IN THE XUV WAVELENGTH RANGE, AND BF AND LMAG STRUCTURES MANUFACTURED ACCORDING TO THIS METHODDec 08, 10Aug 29, 13[G02B]
Recent Patents
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Title
Filing Date
Issue Date
Intl Class
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0037,706 Device and method for performing X-ray analysisAbandonedAug 08, 06Feb 14, 08[G01N, G01T]
2004/0240,623 Device for the examination of samples by means of x-raysAbandonedJun 07, 04Dec 02, 04[H05G]
2004/0126,282 Sample container, measuring device and method for X-ray analysis of liquidsAbandonedSep 08, 03Jul 01, 04[B01L]
6487270 Apparatus for X-ray analysis with a simplified detector motionExpiredApr 24, 96Nov 26, 02[G01T]
6452190 Radiation detector provided with an absorption chamber and a plurality of avalanche chambersExpiredJul 21, 00Sep 17, 02[G01T]
6393093 X-ray analysis apparatus with an X-ray detector in the form of a CCD arrayExpiredDec 21, 00May 21, 02[G01N]
6359964 X-ray analysis apparatus including a parabolic X-ray mirror and a crystal monochromatorExpiredNov 23, 99Mar 19, 02[G01N]
6349128 Method and device using x-rays to measure thickness and composition of thin filmsExpiredApr 27, 00Feb 19, 02[G01N]
6226348 X-ray diffractometer method for determining thickness of multiple non-metallic crystalline layers and fourier transform methodExpiredDec 15, 98May 01, 01[G01N]
6108401 Method of standard-less phase analysis by means of a diffractogramExpiredDec 18, 98Aug 22, 00[G01N]
5432832 Combination of X-ray diffractometer and solid state detector and method of use thereofExpiredAug 02, 93Jul 11, 95[G01N]
5357551 X-ray analysis apparatus with pulse amplitude shift correction and detector reading circuit means suited for use in such an apparatusExpiredApr 15, 93Oct 18, 94[G01N]
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