PANALYTICAL B.V.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 35171
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 937
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 9119
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 844
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
C03B MANUFACTURE OR SHAPING OF GLASS, OR OF MINERAL OR SLAG WOOL; SUPPLEMENTARY PROCESSES IN THE MANUFACTURE OR SHAPING OF GLASS, OR OF MINERAL OR SLAG WOOL 146
 
  
 
C04B LIME; MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS 167
 
  
 
E21B EARTH OR ROCK DRILLING 195
 
  
 
F27D DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE 124

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2013/0220,971 METHOD FOR MANUFACTURING A MULTILAYER STRUCTURE WITH A LATERAL PATTERN FOR APPLICATION IN THE XUV WAVELENGTH RANGE, AND BF AND LMAG STRUCTURES MANUFACTURED ACCORDING TO THIS METHODDec 08, 10Aug 29, 13[G02B]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9911569 X-ray tube anode arrangementJan 12, 16Mar 06, 18[H01J]
9851313 Quantitative X-ray analysis—ratio correctionMar 03, 15Dec 26, 17[G01N]
9784699 Quantitative X-ray analysis—matrix thickness correctionMar 03, 15Oct 10, 17[G01N]
9739730 Quantitative X-ray analysis—multi optical path instrumentMar 04, 15Aug 22, 17[G01N]
9658352 Method of making a standardJan 09, 15May 23, 17[G01N, G01T]
9640292 X-ray apparatusNov 19, 14May 02, 17[G21K, G01N, G01T]
9547094 X-ray analysis apparatusFeb 17, 15Jan 17, 17[G01N, B25J, G01T]
9506880 Diffraction imagingJun 23, 14Nov 29, 16[G01N]
9239305 Sample holderApr 24, 13Jan 19, 16[G01N, B01L]
9110003 MicrodiffractionFeb 28, 13Aug 18, 15[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0037,706 Device and method for performing X-ray analysisAbandonedAug 08, 06Feb 14, 08[G01N, G01T]
2004/0240,623 Device for the examination of samples by means of x-raysAbandonedJun 07, 04Dec 02, 04[H05G]
2004/0126,282 Sample container, measuring device and method for X-ray analysis of liquidsAbandonedSep 08, 03Jul 01, 04[B01L]
6738717 Crystal structure analysis methodExpiredMar 27, 01May 18, 04[G01B]
6731719 X-ray diffractometerExpiredDec 13, 01May 04, 04[G01N]
6487270 Apparatus for X-ray analysis with a simplified detector motionExpiredApr 24, 96Nov 26, 02[G01T]
6452190 Radiation detector provided with an absorption chamber and a plurality of avalanche chambersExpiredJul 21, 00Sep 17, 02[G01T]
6393093 X-ray analysis apparatus with an X-ray detector in the form of a CCD arrayExpiredDec 21, 00May 21, 02[G01N]
6359964 X-ray analysis apparatus including a parabolic X-ray mirror and a crystal monochromatorExpiredNov 23, 99Mar 19, 02[G01N]
6349128 Method and device using x-rays to measure thickness and composition of thin filmsExpiredApr 27, 00Feb 19, 02[G01N]
6226348 X-ray diffractometer method for determining thickness of multiple non-metallic crystalline layers and fourier transform methodExpiredDec 15, 98May 01, 01[G01N]
6108401 Method of standard-less phase analysis by means of a diffractogramExpiredDec 18, 98Aug 22, 00[G01N]
6005914 Arc diffractometerExpiredAug 03, 99Dec 21, 99[G01N]
5966423 Arc diffractometerExpiredMar 28, 97Oct 12, 99[G01N]
5585644 Polyethylene naphthalate X-ray windowExpiredDec 07, 95Dec 17, 96[H01J, G01T]
5528657 X-ray apparatusExpiredJan 21, 94Jun 18, 96[H05G]
5479469 Micro-channel platesExpiredMay 31, 94Dec 26, 95[G21K]
5475728 Eucentric motion systemExpiredAug 02, 93Dec 12, 95[G01N]
5432832 Combination of X-ray diffractometer and solid state detector and method of use thereofExpiredAug 02, 93Jul 11, 95[G01N]
5357551 X-ray analysis apparatus with pulse amplitude shift correction and detector reading circuit means suited for use in such an apparatusExpiredApr 15, 93Oct 18, 94[G01N]

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