Park Systems Corp.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 6200
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]414
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3202
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1103
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES152

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9645168 Head limiting movement range of laser spot and atomic force microscope having the sameDec 23, 15May 09, 17[B82Y, G01Q]
9645169 Measurement apparatus and method with adaptive scan rateAug 31, 15May 09, 17[G01Q]
9081272 Leveling apparatus and atomic force microscope including the sameApr 02, 14Jul 14, 15[B82Y, G01Q, G03F]
8402560 Scanning probe microscope with drift compensationMay 04, 10Mar 19, 13[G01Q]
8209766 Scanning probe microscope capable of measuring samples having overhang structureFeb 12, 10Jun 26, 12[H01J, G01N]
8099793 Scanning probe microscope with automatic probe replacement functionSep 29, 09Jan 17, 12[H01J]
7709791 Scanning probe microscope with automatic probe replacement functionOct 15, 07May 04, 10[G21K, G01N]
7644447 Scanning probe microscope capable of measuring samples having overhang structureNov 17, 06Jan 05, 10[G01N]
7514679 Scanning probe microscope for measuring angle and method of measuring a sample using the sameNov 01, 06Apr 07, 09[H01J, G01N, G02B]
6951129 Scanning probe microscope with improved probe head mountJan 12, 04Oct 04, 05[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0218,285 SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTUREAbandonedMay 04, 10Aug 26, 10[G01Q]
2010/0017,920 SCANNING PROBE MICROSCOPE WITH TILTED SAMPLE STAGEAbandonedJul 13, 09Jan 21, 10[G01N]
2009/0200,462 SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTUREAbandonedFeb 26, 09Aug 13, 09[G01N]
2007/0012,093 Scanning capacitance microscope, method of driving the same, and recording medium storing program for implementing the methodAbandonedFeb 23, 06Jan 18, 07[G01B]
2007/0012,874 Apparatus for and method of driving X-Y scanner in scanning probe microscopeAbandonedJun 07, 05Jan 18, 07[H01J]

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