PERCEPTRON, INC.
Patent Owner
Stats
- 20 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Dec 01, 2015 most recent publication
Details
- 20 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 1,852 Total Citation Count
- Mar 17, 1983 Earliest Filing
- 30 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9204129 Non-contact sensing system having MEMS-based light sourceNov 10, 10Dec 01, 15[H04N, G01S, G01B]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2009/0196,459 Image manipulation and processing techniques for remote inspection deviceAbandonedFeb 29, 08Aug 06, 09[G06K]
2007/0185,379 Modular remote inspection device with digital imagerAbandonedDec 22, 06Aug 09, 07[A61B]
2006/0280,355 Method of evaluating and designing sealing elementsAbandonedJun 14, 05Dec 14, 06[G06K]
2006/0271,332 Method for calibrating a non-contact sensor using a robotAbandonedMar 24, 06Nov 30, 06[G01C]
6858857 Modular non-contact measurement device for quickly and accurately obtaining dimensional measurement dataExpiredMay 05, 03Feb 22, 05[G01B]
6858858 Non-contact measurement device for quickly and accurately obtaining dimensional measurement dataExpiredMay 27, 03Feb 22, 05[G01B]
6769307 Method and system for processing measurement signals to obtain a value for a physical parameterExpiredJul 20, 00Aug 03, 04[G01N]
6717166 Non-contact measurement device for accurately determining angular measurements in relation to plumb and levelExpiredMay 09, 03Apr 06, 04[G01B]
6661820 Method and system for maximizing safe laser power of structured laser light projectors used with imaging sensorsExpiredAug 09, 00Dec 09, 03[H01S]
6481289 Method and system for processing measurement signals to obtain a value for physical parameterExpiredJan 17, 02Nov 19, 02[G01N]
6285959 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate systemExpiredAug 20, 99Sep 04, 01[G01B]
6239436 Method and system for inspecting a low gloss surface of an object at a vision stationExpiredDec 24, 98May 29, 01[G01N]
6134507 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate systemExpiredMay 04, 98Oct 17, 00[G01B]
6128081 Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use thereinExpiredNov 27, 97Oct 03, 00[G01B]
6092419 Method and system for processing measurement signals to obtain a value for a physical parameterExpiredNov 21, 97Jul 25, 00[G01N]
6078846 Calibration and compensation of robot-based gauging systemExpiredJan 19, 98Jun 20, 00[G06F, G06G]
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