PHOTON DYNAMICS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 26133
 
  
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 9124
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 5201
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS396
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 375
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 3239
 
  
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 291
 
  
 
C09K MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR293
 
  
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 299

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0146,567 SYSTEMS AND METHODS FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAYS USING CELL CONTACT PROBING PADSNov 22, 16May 25, 17[G09G, G01R]
2016/0299,103 APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSOct 02, 14Oct 13, 16[H01J, G01N]
2014/0266,244 SYSTEMS AND METHODS FOR REAL-TIME MONITORING OF DISPLAYS DURING INSPECTIONMar 16, 14Sep 18, 14[G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9535273 Apparatus for viewing through optical thin film color filters and their overlapsJul 21, 11Jan 03, 17[H04N, G02B, G02F]
9523714 Electrical inspection of electronic devices using electron-beam induced plasma probesJan 15, 14Dec 20, 16[H01J, G01R]
9103876 Automatic probe configuration station and method thereforJan 07, 11Aug 11, 15[G01R]
8866899 Systems and methods for defect detection using a whole raw imageJun 07, 11Oct 21, 14[H04N, G06T, G01N]
8801964 Encapsulated polymer network liquid crystal material, device and applicationsDec 22, 10Aug 12, 14[C09K, G02F]
8773140 System and method for inspection of electrical circuitsJul 26, 11Jul 08, 14[G01R]
8728589 Laser decal transfer of electronic materialsJan 07, 08May 20, 14[C23C, H05B]
8390926 High speed acquisition vision system and method for selectively viewing object featuresAug 12, 10Mar 05, 13[G01J, G02B]
8025542 Method of performing an operation with rheological compoundMay 14, 07Sep 27, 11[H01J]
7977602 Laser ablation using multiple wavelengthsMar 19, 08Jul 12, 11[B23K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0294,291 APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONSAbandonedSep 17, 15Oct 12, 17[H01J]
2015/0097,592 DIRECT TESTING FOR PERIPHERAL CIRCUITS IN FLAT PANEL DEVICESAbandonedOct 07, 14Apr 09, 15[G09G, G01R]
2009/0295,425 DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYSAbandonedAug 12, 09Dec 03, 09[G01R]
2008/0315,908 DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYSAbandonedAug 29, 08Dec 25, 08[G01R]
7401976 Detection of defects by thermographic analysisExpiredAug 25, 00Jul 22, 08[G01N]
2008/0157,802 DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYSAbandonedMar 12, 08Jul 03, 08[G01R]
7330583 Integrated visual imaging and electronic sensing inspection systemsExpiredAug 19, 02Feb 12, 08[G06K]
7308157 Method and apparatus for optical inspection of a displayExpiredFeb 02, 04Dec 11, 07[G06K]
7301133 Tracking auto focus systemExpiredDec 20, 05Nov 27, 07[G01N]
2007/0151,296 METHOD AND APPARATUS FOR HANDLING AND ALIGNING GLASS SUBSTRATESAbandonedDec 20, 06Jul 05, 07[C03B]
2007/0045,566 Substrate Alignment Using Linear Array SensorAbandonedAug 29, 06Mar 01, 07[G01N]
7180084 Method and apparatus for high-throughput inspection of large flat patterned media using dynamically programmable optical spatial filteringExpiredMar 15, 06Feb 20, 07[G01N]
7095883 Moire suppression method and apparatusExpiredJul 03, 02Aug 22, 06[G06K]
7041998 Method and apparatus for high-throughput inspection of large flat patterned media using dynamically programmable optical spatial filteringExpiredMar 24, 03May 09, 06[G01N]
6933013 Vacuum deposition of dielectric coatings on volatile materialExpiredOct 14, 03Aug 23, 05[C23C, G02F]
2005/0077,005 Method for fabricating electro-optic light modulatorAbandonedOct 14, 03Apr 14, 05[C03C, G02F, B32B]
6866887 Method for manufacturing PDLC-based electro-optic modulator using spin coatingExpiredOct 14, 03Mar 15, 05[B05D]
6840667 Method and apparatus for detection of defects using thermal stimulationExpiredApr 18, 03Jan 11, 05[G01N]
2004/0086,166 Method and apparatus for flat patterned media inspectionAbandonedMay 16, 03May 06, 04[G06K]
2004/0010,444 Automated infrared printed circuit board failure diagnostic systemAbandonedApr 17, 03Jan 15, 04[G06F]

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