PIVOTAL SYSTEMS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G05D SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES 876
 
  
 
G01F MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 554
 
  
 
F16K VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING469
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
  
 
G01P MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT 255
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 2283
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9904297 Method and apparatus for gas flow controlSep 02, 14Feb 27, 18[F16K, G05D]
9523435 Method and apparatus for gas flow controlSep 02, 14Dec 20, 16[F16K, G05D]
9400004 Transient measurements of mass flow controllersNov 29, 11Jul 26, 16[F16K, G05D, F15D, G01F]
8857456 Method and apparatus for in situ testing of gas flow controllersAug 13, 12Oct 14, 14[G05D, G01F]
8667830 Method and apparatus for in situ testing of gas flow controllersSep 27, 10Mar 11, 14[G01P]
8393197 Method and apparatus for the measurement of atmospheric leaks in the presence of chamber outgassingJul 24, 09Mar 12, 13[G01M]
8271210 Method and apparatus for enhancing in-situ gas flow measurement performanceDec 09, 09Sep 18, 12[G06F]
8271211 Method and apparatus for enhancing in-situ gas flow measurement performanceDec 09, 09Sep 18, 12[G01F]
8265888 Method and apparatus for enhancing in-situ gas flow measurement performanceDec 09, 09Sep 11, 12[G01F]
8240324 Method and apparatus for in situ testing of gas flow controllersJan 16, 09Aug 14, 12[G05D]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0161,953 Mass Flow Controller with Multiple Communication ProtocolsAbandonedDec 03, 14Jun 09, 16[G05B, G05D]
2011/0108,126 METHOD AND APPARATUS FOR GAS FLOW CONTROLAbandonedOct 15, 10May 12, 11[F15D]
7871830 End point detection method for plasma etching of semiconductor wafers with low exposed areaExpiredJan 18, 06Jan 18, 11[H01L]

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