PROBE TECHNOLOGY, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 1132
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6530148 Method for making a probe apparatus for testing integrated circuitsMay 26, 00Mar 11, 03[H01R, H05K]
6204674 Assembly structure for making integrated circuit chip probe cardsOct 31, 97Mar 20, 01[G01R]
6064215 High temperature probe card for testing integrated circuitsApr 08, 98May 16, 00[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7064564 Bundled probe apparatus for multiple terminal contactingExpiredFeb 01, 01Jun 20, 06[G01R]

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