QC SOLUTIONS, INC.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2002/0036,774 Apparatus and method for handling and testing of wafersAbandonedJul 25, 01Mar 28, 02[G01N]
4544887 Method of measuring photo-induced voltage at the surface of semiconductor materialsExpiredOct 21, 82Oct 01, 85[G01R]

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