QUALITAU, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 17142
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 6127
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 155
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 145
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 199
 
  
 
H02M APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF 1101
 
  
 
H03F AMPLIFIERS 182

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9772351 Pulsed current source with internal impedance matchingNov 07, 16Sep 26, 17[H03F, G01R]
9196516 Wafer temperature measurement toolMar 14, 13Nov 24, 15[G01K, H01L]
7888951 Integrated unit for electrical/reliability testing with improved thermal controlFeb 10, 09Feb 15, 11[G01R]
7812589 Modified current source (MCS) with seamless range switchingAug 28, 08Oct 12, 10[G05F, G01R]
7602201 High temperature ceramic socket configured to test packaged semiconductor devicesJun 22, 07Oct 13, 09[H01K, H01R, G01R]
7602205 Electromigration tester for high capacity and high currentFeb 19, 08Oct 13, 09[G01R]
7598760 High temperature ceramic die package and DUT board socketMay 21, 08Oct 06, 09[G01R]
7576550 Automatic multiplexing system for automated wafer testingMar 30, 07Aug 18, 09[G01R]
7511517 Semi-automatic multiplexing system for automated semiconductor wafer testingNov 08, 05Mar 31, 09[G01R]
7429856 Voltage source measurement unit with minimized common mode errorsNov 20, 07Sep 30, 08[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0131,326 PULSED CURRENT SOURCE WITH INTERNAL IMPEDANCE MATCHINGAbandonedNov 10, 15May 11, 17[G01R]
2008/0315,862 SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTSAbandonedJun 21, 07Dec 25, 08[G01R]
6469494 Programmable connectorExpiredNov 03, 99Oct 22, 02[H01H]

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