RAVE LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 1345
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 698
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]315
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0266,165 DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURESMay 20, 16Sep 15, 16[B08B, G01N, G01Q]
2016/0158,807 DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURESJan 29, 16Jun 09, 16[B08B]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9588420 Apparatus and method for indirect surface cleaningFeb 19, 16Mar 07, 17[B08B, G03F]
9285674 Apparatus and method for indirect surface cleaningMar 12, 15Mar 15, 16[B08B, G03F]
8986460 Apparatus and method for indirect surface cleaningJun 03, 14Mar 24, 15[B08B, G03F]
8741067 Apparatus and method for indirect surface cleaningNov 11, 13Jun 03, 14[B08B]
8696818 Debris removal in high aspect structuresOct 15, 12Apr 15, 14[B08B]
8613803 Apparatus and method for indirect surface cleaningOct 22, 12Dec 24, 13[B08B]
8562749 Wafer fabrication processMay 20, 12Oct 22, 13[B08B]
8334084 Method for fabricating high aspect ratio nanostructuresAug 19, 11Dec 18, 12[G03F]
8293019 Apparatus and method for indirect surface cleaningNov 24, 08Oct 23, 12[B08B]
8287653 Debris removal in high aspect structuresSep 17, 07Oct 16, 12[B08B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0130,215 Indented Mold Structures For Diamond Deposited ProbesAbandonedNov 07, 12May 08, 14[G01Q]
2009/0114,850 APPARATUS AND METHOD FOR MODIFYING AN OBJECTAbandonedJan 14, 09May 07, 09[G01N]
7495240 Apparatus and method for modifying an objectExpiredMay 02, 06Feb 24, 09[H01L, G01N]
7323699 Apparatus and method for modifying an objectExpiredFeb 02, 05Jan 29, 08[G01N]
2007/0181,545 Method and apparatus for controlling sample position during material removal or additionAbandonedFeb 06, 06Aug 09, 07[B23K]

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