RAYTEX CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 7199
 
  
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 1132
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7633617 Defective particle measuring apparatus and defective particle measuring methodFeb 03, 06Dec 15, 09[G01N]
7616300 Edge flaw detection deviceAug 10, 05Nov 10, 09[G01N]
7255719 Wafer rotation device and edge flaw inspection apparataus having the deviceAug 08, 03Aug 14, 07[H01L]
6236056 Defect evaluation apparatus for evaluating defects and shape information thereof in an object or on the surface of an objectSep 28, 98May 22, 01[G01N]
5471298 Method and apparatus for measuring size of particle or defectMar 25, 93Nov 28, 95[G01N]
5428655 Method and apparatus for three-dimensional detection of particlesSep 10, 93Jun 27, 95[G01N]
5424536 Substrate internal defect and external particle detecting apparatus using s-polarized and p-polarized lightMar 22, 94Jun 13, 95[G02F]
5381016 Method and apparatus for measuring photoluminescence in crystalMar 25, 93Jan 10, 95[G01N]
5196716 Method and apparatus for measuring internal defects for position and depthMay 17, 91Mar 23, 93[G01N]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0201,495 Calibration Method For Edge Inspection ApparatusAbandonedJun 14, 07Aug 13, 09[G01N]
2009/0091,747 Edge flaw detection deviceAbandonedAug 10, 05Apr 09, 09[G01N]
6798503 Edge flaw inspection deviceExpiredMar 27, 03Sep 28, 04[G01N]
6760060 Observation apparatus for observing a defect in a moving target object using scattered lightExpiredDec 16, 99Jul 06, 04[H04N]
6118133 Apparatus and method for observing defect having marks making meansExpiredAug 24, 98Sep 12, 00[G01N]

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