RIGAKU CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 103105
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 2027
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 19109
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 1240
 
  
 
H05G X-RAY TECHNIQUE 1030
 
  
 
A61B DIAGNOSIS; SURGERY; IDENTIFICATION 8232
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 7191
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 5130
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS495
 
  
 
F16J PISTONS; CYLINDERS; PRESSURE VESSELS IN GENERAL; SEALINGS347

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0052,121 X-RAY DIFFRACTION APPARATUSAug 04, 17Feb 22, 18[G01N]
2017/0370,860 PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAMJun 09, 17Dec 28, 17[G01N]
2017/0074,809 X-RAY SMALL ANGLE OPTICAL SYSTEMSep 08, 16Mar 16, 17[G01N]
2017/0045,466 SENSOR UNIT FOR THERMAL ANALYSIS EQUIPMENT AND THERMAL ANALYSIS EQUIPMENTAug 10, 16Feb 16, 17[G01N]
2017/0038,315 OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD THEREFOR, AND OPERATION GUIDE PROGRAM THEREFORAug 03, 16Feb 09, 17[G01N]
2017/0004,950 X-RAY GENERATOR AND ADJUSTMENT METHOD THEREFORJun 29, 16Jan 05, 17[H01J]
2014/0278,147 CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFICATION DEVICE, AND CRYSTALLINE PHASE IDENTIFICATION PROGRAMMar 13, 14Sep 18, 14[G01N]
2013/0126,745 SEMICONDUCTOR X-RAY DETECTORJul 29, 11May 23, 13[G01T]
2012/0161,027 X-RAY DETECTORDec 27, 11Jun 28, 12[G01T]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9895129 CT-image processing apparatus and methodMar 15, 16Feb 20, 18[G06T, A61B, G06K]
9791393 X-ray detection signal processing device and X-ray analyzing apparatus using sameMay 14, 15Oct 17, 17[H01J, G01N, H03F, G01R, H05G]
9778214 X-ray analyzing apparatusMar 14, 17Oct 03, 17[G01N, G01T]
9746084 Magnetic fluid sealing apparatusSep 12, 14Aug 29, 17[F16C, F16J]
9746433 X-ray fluorescence spectrometer and X-ray fluorescence analyzing methodDec 27, 16Aug 29, 17[G01N]
9691594 Method for analysis of sample and apparatus thereforJun 27, 14Jun 27, 17[H01J, G01N]
9658174 X-ray topography apparatusNov 12, 14May 23, 17[G21K, G01N]
9618461 X-ray analysis apparatusOct 10, 13Apr 11, 17[G01N, G01T]
9583530 X-ray detectorDec 27, 11Feb 28, 17[H01L, G01T]
9562867 Optical axis adjustment device for X-ray analyzerNov 05, 14Feb 07, 17[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0212,213 RADIATION DETECTOR, AND X-RAY ANALYSIS APPARATUS AND RADIATION DETECTION METHOD USING THE SAMEAbandonedOct 24, 14Jul 30, 15[G01N, G01T]
2014/0284,478 X-RAY ANALYZING APPARATUSAbandonedMar 24, 14Sep 25, 14[G01T]
2014/0119,512 X-RAY DETECTOR AND X-RAY DIFFRACTION DEVICEAbandonedSep 23, 13May 01, 14[G01N, G01T]
2014/0034,842 ELECTRONIC VARIABLE GAIN FOR X-RAY DETECTORAbandonedJul 01, 13Feb 06, 14[G01T]
2014/0029,729 GRADIENT VACUUM FOR HIGH-FLUX X-RAY SOURCEAbandonedJun 26, 13Jan 30, 14[H01J]
2014/0029,730 TENSIONED FLAT ELECTRON EMITTER TAPEAbandonedJun 26, 13Jan 30, 14[H01J]
8503611 X-ray topography apparatusExpiredJan 03, 11Aug 06, 13[G01N]
2013/0062,721 SEMICONDUCTOR STRIP DETECTORAbandonedAug 13, 12Mar 14, 13[H01L]
8085900 Method for X-ray wavelength measurement and X-ray wavelength measurement apparatusExpiredDec 22, 09Dec 27, 11[G21K]
7989761 Gas analyzing method and gas analyzing apparatusExpiredDec 31, 08Aug 02, 11[H01J, B01D]
7922386 Thermal analysis apparatusExpiredSep 26, 07Apr 12, 11[G01N]
7679246 ActuatorExpiredJul 08, 04Mar 16, 10[H02K]
7535992 X-ray diffraction apparatusExpiredJun 28, 06May 19, 09[H01J]
7450685 X-ray fluorescence spectrometer and program for use therewithExpiredOct 17, 06Nov 11, 08[G01N]
7443952 X-ray diffraction measurement method and X-ray diffraction apparatusExpiredOct 08, 07Oct 28, 08[G01N]
2008/0240,354 Method for X-ray wavelength measurement and X-ray wavelength measurement apparatusAbandonedJun 28, 07Oct 02, 08[G01T]
7400705 Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatusExpiredJun 09, 03Jul 15, 08[G01N]
2008/0152,090 Euv Light SourceAbandonedAug 19, 04Jun 26, 08[H01J]
2008/0080,591 Sensor unit of thermal analysis equipment and method of manufacturing the sameAbandonedOct 02, 07Apr 03, 08[G01K]
7342995 Apparatus for estimating specific polymer crystalExpiredAug 18, 04Mar 11, 08[G01N]

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