Rika Denshi America, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7315176 Electrical test probes, methods of making, and methods of usingJun 16, 05Jan 01, 08[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7545159 Electrical test probes with a contact element, methods of making and using the sameExpiredJan 10, 07Jun 09, 09[G01R]
6685492 Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational conditionExpiredMay 17, 02Feb 03, 04[H01R, G01R]
6667629 Electrical test probes and methods of making the sameExpiredSep 24, 02Dec 23, 03[G01R]
6652326 Contact apparatus particularly useful with test equipmentExpiredJul 11, 01Nov 25, 03[H01R]
6275054 Electrical contact systemExpiredNov 15, 99Aug 14, 01[H01R]
6159056 Electrical contact assembly for interconnecting test apparatus and the likeExpiredNov 15, 99Dec 12, 00[H01R]
6053777 Coaxial contact assembly apparatusExpiredSep 02, 98Apr 25, 00[H01R]

Top Inventors for This Owner

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