SCANIMETRICS INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 5154
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 159
 
  
 
G01H MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES 120
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G05B CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 1100
 
  
 
G08C TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS 154
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H04Q SELECTING 1109

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2015/0323,435 Containment integrity sensor deviceMay 12, 15Nov 12, 15[G01M, G01N]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9329579 Wireless sensor deviceFeb 17, 11May 03, 16[G01H, H04L, G05B, G01B, G01D, H05K]
8928343 Testing of electronic circuits using an active probe integrated circuitApr 03, 08Jan 06, 15[G01R]
8829934 Method and apparatus for interrogating electronic equipment componentsFeb 26, 09Sep 09, 14[H04Q, G08C, G01R]
8028208 Wireless radio frequency technique design and method for testing of integrated circuits and wafersFeb 26, 07Sep 27, 11[G01R]
7183788 Wireless radio frequency technique design and method for testing of integrated circuits and wafersMar 01, 04Feb 27, 07[G01R]
7109730 Non-contact tester for electronic circuitsApr 25, 05Sep 19, 06[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8669656 Interconnect having ultra high speed signal transmission/receptionExpiredJan 28, 13Mar 11, 14[H01L]
2013/0207,681 METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENTAbandonedJan 30, 13Aug 15, 13[G01R]
8390307 Method and apparatus for interrogating an electronic componentExpiredMar 06, 07Mar 05, 13[G01R]
8373429 Method and apparatus for interrogating an electronic componentExpiredSep 09, 08Feb 12, 13[G01R]
8362481 Ultra high speed signal transmission/receptionExpiredApr 13, 10Jan 29, 13[H01L]
8362587 Ultra high speed signal transmission/reception interconnectExpiredMay 08, 08Jan 29, 13[H01L]
8125237 Thin film transistor array having test circuitryExpiredJul 17, 07Feb 28, 12[G01R]
6885202 Non-contact tester for electronic circuitsExpiredSep 19, 03Apr 26, 05[G01R]
6759863 Wireless radio frequency technique design and method for testing of integrated circuits and wafersExpiredMay 15, 01Jul 06, 04[G01R]

Top Inventors for This Owner

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