SCANNER TECHNOLOGIES CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
5909285 Three dimensional inspection systemOct 21, 97Jun 01, 99[G01B, G06K]
5276546 Three dimensional scanning systemSep 16, 92Jan 04, 94[G02B]
5173796 Three dimensional scanning systemMay 20, 91Dec 22, 92[G02B]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7653237 Method of manufacturing ball array devices using an inspection apparatus having two or more cameras and ball array devices produced according to the methodExpiredApr 16, 07Jan 26, 10[G06K]
7570798 Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the methodExpiredApr 16, 07Aug 04, 09[G06K]
7508974 Electronic component products and method of manufacturing electronic component productsExpiredFeb 28, 05Mar 24, 09[G06K]
7085411 Method of manufacturing electronic components including a method for three dimensional inspectionExpiredFeb 28, 05Aug 01, 06[G06K]
7079678 Electronic component products made according to a process that includes a method for three dimensional inspectionExpiredFeb 28, 05Jul 18, 06[G06K]
6915006 Method and apparatus for three dimensional inspection of electronic componentsExpiredApr 27, 01Jul 05, 05[G06K]
6915007 Method and apparatus for three dimensional inspection of electronic componentsExpiredApr 27, 01Jul 05, 05[G06K]
6862365 Method and apparatus for three dimensional inspection of electronic componentsExpiredJul 13, 99Mar 01, 05[G06K]
6072898 Method and apparatus for three dimensional inspection of electronic componentsExpiredJan 16, 98Jun 06, 00[G06K]
6064756 Apparatus for three dimensional inspection of electronic componentsExpiredMay 28, 99May 16, 00[G06K]
6064757 Process for three dimensional inspection of electronic componentsExpiredMay 28, 99May 16, 00[G06K]
6055054 Three dimensional inspection systemExpiredMay 05, 97Apr 25, 00[G01B, G06K]
5574668 Apparatus and method for measuring ball grid arraysExpiredFeb 22, 95Nov 12, 96[G06F]
5307149 Method and apparatus for zero force part placementExpiredAug 14, 92Apr 26, 94[G01B]

Top Inventors for This Owner

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