SCHLUMBERGER TECHNOLOGIES, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
E21B EARTH OR ROCK DRILLING 294
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G01V GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 179
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 179
 
  
 
H04R LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS 1106

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8305845 Methods and systems for seismic signal detectionJan 08, 12Nov 06, 12[H04R, G01V]
7388380 While-drilling apparatus for measuring streaming potentials and determining earth formation characteristics and other useful informationSep 09, 05Jun 17, 08[G01V]
6750455 Method and apparatus for multiple charged particle beamsJul 02, 01Jun 15, 04[G01J]
6354373 Expandable tubing for a well bore hole and method of expandingNov 25, 98Mar 12, 02[E21B]
6308270 Validating and certifying execution of a software program with a smart cardFeb 13, 98Oct 23, 01[G06F]
5710517 Accurate alignment of clocks in mixed-signal testerAug 01, 95Jan 20, 98[H03L]
5321632 Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveformFeb 24, 92Jun 14, 94[G01R, G01B]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8490704 Technique of fracturing with selective stream injectionExpiredAug 02, 10Jul 23, 13[E21B]
7093177 Low-jitter clock for test systemExpiredMar 19, 02Aug 15, 06[G01R]
2002/0074,494 Precise, in-situ endpoint detection for charged particle beam processingAbandonedDec 15, 00Jun 20, 02[G21G, G21K, G01N, A61N]
6078898 System and method of transactional taxation using secure stored data devicesExpiredMar 18, 98Jun 20, 00[G06F]
6073841 System and method of tracking continuing education information using secure stored data devicesExpiredMar 24, 98Jun 13, 00[G06K]
5402475 Monitoring and control of parking management system by remoteExpiredMar 31, 93Mar 28, 95[H04M]
5297057 Method and apparatus for design and optimization for simulation of motion of mechanical linkagesExpiredNov 13, 91Mar 22, 94[G06F]
5253189 Qualitative kinematicsExpiredJun 13, 89Oct 12, 93[G06G]
5216361 Modular board test system having wireless receiverExpiredJul 10, 91Jun 01, 93[G01R]
5163101 Bitplane area correlatorExpiredSep 26, 89Nov 10, 92[G06K]
5146159 Pin driver for in-circuit test apparatusExpiredFeb 01, 91Sep 08, 92[H03F, G01R]
5119444 System for expedited computation of laplacian and gaussian filters and correlation of their outputs for image processingExpiredJul 22, 86Jun 02, 92[G06K]
5109430 Mask alignment and measurement of critical dimensions in integrated circuitsExpiredOct 24, 90Apr 28, 92[G06K]
5062567 Lead design to facilitate post-reflow solder joint quality inspectionExpiredMay 01, 90Nov 05, 91[H05K]
5050170 Apparatus for combining signals from first and second information processing elementsExpiredSep 04, 87Sep 17, 91[G01R]
5043929 Closed-form kinematicsExpiredJun 13, 89Aug 27, 91[G06F]
5014228 Method and apparatus for calibrating linear delay linesExpiredSep 21, 89May 07, 91[G01R]
4994732 Automatic test system having a "true tester-per-pin" architectureExpiredOct 05, 89Feb 19, 91[G01R, G01F]
4973015 Manipulator apparatus for test head support and orientationExpiredSep 09, 88Nov 27, 90[F16M]
4965842 Method and apparatus for measuring feature dimensions using controlled dark-field illuminationExpiredDec 14, 87Oct 23, 90[G06K]

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