SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 11148
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3359
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 157
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0252,565 NON-CONTACT METHOD TO MONITOR AND QUANTIFY EFFECTIVE WORK FUNCTION OF METALSFeb 26, 16Sep 01, 16[H01L, G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7202691 Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafersJul 27, 05Apr 10, 07[G01R]
7160742 Methods for integrated implant monitoringJul 19, 04Jan 09, 07[H01L]
6597193 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentMar 16, 01Jul 22, 03[G01R]
6512384 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltagesSep 28, 00Jan 28, 03[G01R]
6388455 Method and apparatus for simulating a surface photo-voltage in a substrateJan 13, 00May 14, 02[G01R]
6325078 Apparatus and method for rapid photo-thermal surface treatmentJan 07, 98Dec 04, 01[B08B]
6069017 Method for real-time in-line testing of semiconductor wafersMay 08, 97May 30, 00[H01L, G01R]
5661408 Real-time in-line testing of semiconductor wafersMar 01, 95Aug 26, 97[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0182,347 Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (SOI) wafer manufacturingAbandonedDec 03, 07Jul 31, 08[H01L, B05C]
7403023 Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.ExpiredMar 14, 06Jul 22, 08[G01R]
2008/0048,636 Method and apparatus for silicon-on-insulator material characterizationAbandonedAug 16, 07Feb 28, 08[G01J]
2008/0036,464 Probes and methods for semiconductor wafer analysisAbandonedJul 27, 07Feb 14, 08[G01N]
2008/0020,549 Method and apparatus for forming an oxide layer on semiconductorsAbandonedJul 20, 06Jan 24, 08[H01L]
6967490 Real-time in-line testing of semiconductor wafersExpiredMar 28, 03Nov 22, 05[G01R]
6924657 Real-time in-line testing of semiconductor wafersExpiredMar 28, 03Aug 02, 05[G01R]
6909302 Real-time in-line testing of semiconductor wafersExpiredAug 17, 01Jun 21, 05[G01R]
6803588 Apparatus and method for rapid photo-thermal surfaces treatmentExpiredOct 10, 01Oct 12, 04[H01L]
6315574 Method for real-time in-line testing of semiconductor wafersExpiredJan 20, 00Nov 13, 01[H01L]

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