Semitest Inc.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6163163 Semiconductor material characterizing method and apparatusExpiredNov 04, 99Dec 19, 00[G01R]
6097205 Method and apparatus for characterizing a specimen of semiconductor materialExpiredSep 30, 97Aug 01, 00[G01R]
6034535 Method utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor materialExpiredJun 12, 97Mar 07, 00[G01N, G01R]
5453703 Method for determining the minority carrier surface recombination lifetime constant (t.sub.s of a specimen of semiconductor materialExpiredNov 29, 93Sep 26, 95[G01R]
5091691 Apparatus for making surface photovoltage measurements of a semiconductorExpiredDec 07, 88Feb 25, 92[H01L, G01R]
5087876 Apparatus and method for making surface photovoltage measurements of a semiconductorExpiredJul 16, 90Feb 11, 92[G01R]
4891584 Apparatus for making surface photovoltage measurements of a semiconductorExpiredMar 21, 88Jan 02, 90[G01R]
4827212 Noninvasive method and apparatus for characterization of semiconductorsExpiredJan 20, 88May 02, 89[G01R]

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