SGS-THOMSON MICROELECTRONICS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 189194
 
  
 
G11C STATIC STORES 10969
 
  
 
H03K PULSE TECHNIQUE 5777
 
  
 
H02P CONTROL OR REGULATION OF ELECTRIC MOTORS, GENERATORS, OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS 4147
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 3368
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 22425
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 17139
 
  
 
H03F AMPLIFIERS 1667
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 9150
 
  
 
H02K DYNAMO-ELECTRIC MACHINES 998

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7535502 Pixel correction system and method for CMOS imagersJul 03, 03May 19, 09[H04N]
6504572 Circuit for detecting leaky access switches in CMOS imager pixelsNov 05, 97Jan 07, 03[H04N]
6483931 Electrostatic discharge protection of a capacitve type fingerprint sensing arraySep 11, 97Nov 19, 02[G06K]
RE37477 Integrated circuit protected against electrostatic discharges, with variable protection thresholdSep 21, 95Dec 18, 01[H02H]
6195398 Method and apparatus for coding and communicating data in noisy environmentDec 19, 97Feb 27, 01[H04K]
6087697 Radio frequency power MOSFET device having improved performance characteristicsOct 31, 97Jul 11, 00[H01L]
6064109 Ballast resistance for producing varied emitter current flow along the emitter's injecting edgeJun 07, 95May 16, 00[H01L]
6043687 Integrated circuit precision resistor ratio matchingJul 29, 98Mar 28, 00[H02P]
6014050 Variable impedance delay elementsFeb 18, 97Jan 11, 00[H03K]
RE36443 Dialer with internal option select circuit programmed with externally hardwired addressJul 30, 97Dec 14, 99[H03K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5587674 Comparator with built-in hysteresisExpiredApr 07, 95Dec 24, 96[H03K]
D359028 Socketed integrated circuit packageExpiredSep 02, 93Jun 06, 95[]
D358804 Detachable integrated circuit moduleExpiredSep 02, 93May 30, 95[]
D358805 Detachable integrated circuit moduleExpiredSep 24, 93May 30, 95[]
D358806 Socketed integrated circuit packageExpiredSep 24, 93May 30, 95[]
D354274 Low-profile detachable integrated circuit moduleExpiredApr 08, 94Jan 10, 95[]
D354275 Low-profile detachable integrated circuit moduleExpiredApr 08, 94Jan 10, 95[]
5315241 Method for testing integrated circuitsExpiredSep 18, 91May 24, 94[G01R]
5267197 Read/write memory having an improved write driverExpiredDec 13, 90Nov 30, 93[G11C]
5265054 Semiconductor memory with precharged redundancy multiplexingExpiredDec 14, 90Nov 23, 93[G11C]
5265100 Semiconductor memory with improved test modeExpiredJul 13, 90Nov 23, 93[G01R]
5258952 Semiconductor memory with separate time-out control for read and write operationsExpiredDec 14, 90Nov 02, 93[G11C]
5206817 Pipelined circuitry for allowing the comparison of the relative difference between two asynchronous pointers and a programmable valueExpiredOct 18, 90Apr 27, 93[G06F]
5200304 Silver halide color photographic materialExpiredDec 14, 90Apr 06, 93[G03C]
5196233 Method for fabricating semiconductor circuitsExpiredJan 18, 89Mar 23, 93[H01L]
5170373 Three transistor EEPROM cellExpiredOct 31, 89Dec 08, 92[G11C]
5161159 Semiconductor memory with multiple clocking for test mode entryExpiredAug 17, 90Nov 03, 92[G06F]
5159599 High speed testing for programmable logic devicesExpiredJul 31, 90Oct 27, 92[G01R]
5151376 Method of making polycrystalline silicon resistors for integrated circuitsExpiredMay 31, 90Sep 29, 92[H01L]
5143861 Method making a dynamic random access memory cell with a tungsten plugExpiredMar 06, 89Sep 01, 92[H01L]

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