SIEMENS MILLTRONICS PROCESS INSTRUMENTS, INC.
Patent Owner
Stats
- 1 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Sep 01, 2011 most recent publication
Details
- 1 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 442 Total Citation Count
- Mar 19, 1985 Earliest Filing
- 21 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
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Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2006/0265,152 Level measurement device operating under stored program control and including a program update module mechanismAbandonedMay 03, 05Nov 23, 06[G06F]
2005/0281,134 Method and apparatus for pulse-by-pulse calibration of a pulse-echo ranging systemAbandonedJun 17, 04Dec 22, 05[G01S]
2005/0076,701 Method and apparatus for non-iterative calibration of current output in time-of-flight ranging systemsAbandonedSep 30, 03Apr 14, 05[G01F]
2005/0076,728 Motion and fundamental frequency doubling planar and spatial linkage mechanisms and applications thereforeAbandonedSep 02, 04Apr 14, 05[F16H]
2004/0149,029 Reflective coating for a housing enclosure in a level measurement or time flight ranging systemAbandonedSep 16, 03Aug 05, 04[G01F]
2004/0150,606 Temperature compensation mechanism for LCD module in a time of flight ranging systemAbandonedNov 06, 03Aug 05, 04[G09G]
2004/0036,482 Probe for use in level measurement in time domain reflectometryAbandonedMay 30, 03Feb 26, 04[G01R]
2002/0172,789 Electrically conductive polymeric housing for process control equipmentAbandonedMay 17, 01Nov 21, 02[B32B]
6237409 Device for generating a continuous stream of bulk material and determining the transfer rate or batch amount thereofExpiredAug 07, 97May 29, 01[G01F]
5003489 Totalizer apparatus for flow rate measurement devicesExpiredAug 18, 89Mar 26, 91[G01G, G01F]
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