SII NANOTECHNOLOGY INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 23183
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 20108
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 11148
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS693
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3359
 
  
 
B01D SEPARATION 2132
 
  
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 299
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 244
 
  
 
H05B ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR 2109
 
  
 
2403 PROSTHETIC ARTICLES213

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8601608 Cantilever for scanning probe microscope and scanning probe microscope equipped with itMar 30, 06Dec 03, 13[G01Q]
D679026 Compound charged particle beam deviceMay 14, 12Mar 26, 13[2403]
D671654 Compound charged particle beam deviceAug 19, 09Nov 27, 12[2403]
8028567 AFM tweezers, method for producing AFM tweezers, and scanning probe microscopeJun 20, 08Oct 04, 11[G01Q, G01B]
7987703 Tweezer-equipped scanning probe microscope and transfer methodMay 30, 08Aug 02, 11[G01B]
7495215 Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubesDec 28, 05Feb 24, 09[G01N]
7382855 Fluorescent x-ray analysis method and fluorescent x-ray analysis deviceApr 27, 05Jun 03, 08[G01N]
7339383 Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring functionJul 14, 05Mar 04, 08[G01R]
6395347 Micromachining method for workpiece observationNov 30, 94May 28, 02[H01J]
6229609 Scanning near-field optic/atomic force microscopeApr 11, 94May 08, 01[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0215,256 Focused ion beam apparatusAbandonedFeb 15, 11Sep 08, 11[H01J]
7923267 Method of measuring length of measurement object article in micro-structureExpiredFeb 03, 06Apr 12, 11[G01R]
2011/0052,044 METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATIONAbandonedSep 01, 10Mar 03, 11[G06T]
7804067 Method of observing and method of working diamond stylus for working of atomic force microscopeExpiredDec 06, 07Sep 28, 10[G01Q]
2010/0045,306 Microwave resonator and microwave microscope including the sameAbandonedAug 18, 09Feb 25, 10[G01R]
2009/0302,233 CHARGED PARTICLE BEAM APPARATUSAbandonedAug 03, 07Dec 10, 09[H01J]
2009/0283,677 Section image acquiring method using combined charge particle beam apparatus and combined charge particle beam apparatusAbandonedMay 14, 09Nov 19, 09[G01N]
2009/0188,011 TWEEZERS SYSTEM FOR SCANNING PROBE MICROSCOPE, SCANNING PROBE MICROSCOPE APPARATUS AND METHOD OF REMOVING DUSTAbandonedJan 16, 09Jul 23, 09[G12B]
2009/0134,327 Defect recognizing method, defect observing method, and charged particle beam apparatusAbandonedOct 31, 08May 28, 09[G01N]
2009/0092,905 PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION METHODAbandonedJun 25, 08Apr 09, 09[B26D, G03F]
7500779 Thermal analysis apparatusExpiredFeb 13, 07Mar 10, 09[G01N]
7494575 Method for manufacturing a split probeExpiredApr 13, 04Feb 24, 09[C23C, C23F]
2009/0038,383 PHOTOMASK DEFECT CORRECTION DEVICE AND PHOTOMASK DEFECT CORRECTION METHODAbandonedJun 25, 08Feb 12, 09[G01B]
7488961 Charged particle beam irradiation method and charged particle beam apparatusExpiredOct 25, 06Feb 10, 09[H01J, A61N]
2009/0028,420 PHOTOMASK DEFECT-SHAPE RECOGNITION APPARATUS, PHOTOMASK DEFECT-SHAPE RECOGNITION METHOD, AND PHOTOMASK DEFECT CORRECTION METHODAbandonedJul 17, 08Jan 29, 09[G03F, G06K]
2008/0265,158 CHARGED PARTICLE BEAM APPARATUSAbandonedApr 16, 08Oct 30, 08[G01N]
2008/0191,372 MOLD INSPECTING METHOD AND RESIN RESIDUE REMOVING METHOD OF NANOIMPRINT LITHOGRAPHYAbandonedJan 25, 08Aug 14, 08[B28B, B29C]
7404313 Scanning probe microscopeExpiredMar 14, 06Jul 29, 08[G01B]
7398678 Probe for a scanning microscopeExpiredJun 06, 05Jul 15, 08[G01B]
2008/0156,998 Focused Ion Beam ApparatusAbandonedDec 20, 07Jul 03, 08[H01J]

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