SOLID STATE MEASUREMENTS, INC.
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Nov 27, 2008 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 337 Total Citation Count
- Jun 16, 1982 Earliest Filing
- 27 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Recent Publications
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Recent Patents
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Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2008/0290,889 Method of destructive testing the dielectric layer of a semiconductor wafer or sampleAbandonedMay 24, 07Nov 27, 08[G01R]
7327155 Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materialsExpiredNov 17, 05Feb 05, 08[G01R]
7304490 In-situ wafer and probe desorption using closed loop heatingExpiredNov 05, 04Dec 04, 07[G01R]
7295022 Method and system for automatically determining electrical properties of a semiconductor wafer or sampleExpiredAug 31, 05Nov 13, 07[G01R]
2007/0249,073 Method for determining the electrically active dopant density profile in ultra-shallow junction (USJ) structuresAbandonedApr 02, 07Oct 25, 07[H01L, G01R]
7190186 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor waferExpiredSep 28, 04Mar 13, 07[G01R]
7037734 Method and apparatus for determining generation lifetime of product semiconductor wafersExpiredJun 23, 04May 02, 06[H01L]
7026837 Method and apparatus for determining the dielectric constant of a low permittivity dielectric on a semiconductor waferExpiredDec 30, 03Apr 11, 06[G01R]
7023231 Work function controlled probe for measuring properties of a semiconductor wafer and method of use thereofExpiredMay 14, 04Apr 04, 06[G01R]
7007408 Method and apparatus for removing and/or preventing surface contamination of a probeExpiredApr 28, 04Mar 07, 06[F26B]
7005307 Apparatus and method for detecting soft breakdown of a dielectric layer of a semiconductor waferExpiredJun 28, 04Feb 28, 06[H01L]
6972582 Apparatus and method for measuring semiconductor wafer electrical propertiesExpiredFeb 10, 03Dec 06, 05[G01R]
6959481 Apertured probes for localized measurements of a material's complex permittivity and fabrication methodExpiredMar 21, 03Nov 01, 05[G12B]
2005/0225,345 Method of testing semiconductor wafers with non-penetrating probesAbandonedApr 05, 05Oct 13, 05[G01R]
6943562 Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuitsExpiredNov 21, 03Sep 13, 05[G01R]
6894519 Apparatus and method for determining electrical properties of a semiconductor waferExpiredApr 11, 02May 17, 05[G01R]
6879176 Conductance-voltage (GV) based method for determining leakage current in dielectricsExpiredNov 04, 03Apr 12, 05[G01R]
6851096 Method and apparatus for testing semiconductor wafersExpiredAug 08, 02Feb 01, 05[H01L, G06F, G01R]
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