STAR TECHNOLOGIES, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 22137
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9885746 Switching matrix and testing system for semiconductor characteristic measurement using the sameMar 21, 12Feb 06, 18[G01R]
9739830 Test assemblyMay 12, 14Aug 22, 17[G01R]
9535114 Testing deviceNov 27, 13Jan 03, 17[G01R]
9329205 High-precision semiconductor device probing apparatus and system thereofMar 20, 12May 03, 16[G01R]
8988092 Probing apparatus for semiconductor devicesNov 28, 11Mar 24, 15[G01R]
8692570 Probe card for testing high-frequency signalsMay 11, 11Apr 08, 14[G01R]
8389926 Testing apparatus for light-emitting devices with a design for a removable sensing moduleAug 16, 10Mar 05, 13[H01J]
8310264 Method for configuring combinational switching matrix and testing system for semiconductor devices using the sameAug 13, 09Nov 13, 12[G01R]
8279451 Probing apparatus with on-probe device-mapping functionJun 09, 10Oct 02, 12[G01B]
8198725 Heat sink and integrated circuit assembly using the sameDec 31, 09Jun 12, 12[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0109,016 TEST PROBE CARDAbandonedOct 17, 14Apr 23, 15[G02B, G01R]
2014/0340,108 TEST ASSEMBLYAbandonedMay 12, 14Nov 20, 14[G01R]
2013/0229,199 TESTING APPARATUS FOR PERFORMING AVALANCHE TESTAbandonedMar 05, 12Sep 05, 13[G01R]
2013/0229,200 TESTING APPARATUS FOR PERFORMING AN AVALANCHE TEST AND METHOD THEREOFAbandonedMar 05, 12Sep 05, 13[G01R]
2013/0048,344 HIGH FREQUENCY CIRCUIT BOARDAbandonedAug 30, 11Feb 28, 13[H05K]
2013/0030,766 CALIBRATION SYSTEM OF ELECTRONIC DEVICESAbandonedSep 23, 11Jan 31, 13[G06F]
2012/0043,987 Probe Card for Testing Semiconductor Devices and Vertical Probe ThereofAbandonedAug 23, 10Feb 23, 12[G01R]
2011/0063,608 Sensing Module for Light-Emitting Devices and Testing Apparatus Using the SameAbandonedAug 16, 10Mar 17, 11[G01N]
2010/0182,013 PROBING APPARATUS WITH TEMPERATURE-ADJUSTING MODULES FOR TESTING SEMICONDUCTOR DEVICESAbandonedApr 03, 09Jul 22, 10[G01R]
2010/0134,130 INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISMAbandonedFeb 01, 10Jun 03, 10[G01R]
2010/0118,297 MICROSCOPE HAVING MULTIPLE IMAGE-OUTPUTTING DEVICES AND PROBING APPARATUS FOR INTEGRATED CIRCUIT DEVICES USING THE SAMEAbandonedJan 19, 10May 13, 10[G01N, G02B]
2009/0315,578 PROBE AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAMEAbandonedSep 25, 08Dec 24, 09[G01R]
2009/0128,897 MICROSCOPE HAVING MULTIPLE IMAGE- OUTPUTTING DEVICES AND PROBING APPARATUS FOR INTEGRATED CIRCUIT DEVICES USING THE SAMEAbandonedJan 17, 08May 21, 09[H04N, G02B]
2009/0015,283 INTEGRATED CIRCUIT PROBING APPARATUS HAVING A TEMPERATURE-ADJUSTING MECHANISMAbandonedSep 26, 08Jan 15, 09[G01R]
2007/0069,745 PROBE CARD FOR INTEGRATED CIRCUITSAbandonedDec 09, 05Mar 29, 07[G01R]
2005/0280,427 Apparatus for probing multiple integrated circuit devicesAbandonedFeb 15, 05Dec 22, 05[G01R]
2003/0122,563 Probe card and method for manufacturing the sameAbandonedOct 29, 02Jul 03, 03[G01R]
5836826 Machine for making star nailsExpiredJan 14, 97Nov 17, 98[B21G]
5488687 Dual resolution output system for image generatorsExpiredSep 17, 92Jan 30, 96[G06T]
5485528 Apparatus and method for back-projecting an imageExpiredOct 15, 93Jan 16, 96[G06F, G06K]

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