STICHTING VOOR FUNDAMENTEEL ONDERZOEK DER MATERIE

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Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2102
 
  
 
A61B DIAGNOSIS; SURGERY; IDENTIFICATION 1239
 
  
 
H05G X-RAY TECHNIQUE 139

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0171,050 METHOD FOR REGENERATING A SURFACE OF AN OPTICAL ELEMENT IN AN XUV RADIATION SOURCE, AND XUV RADIATION SOURCEAbandonedOct 11, 07Jul 08, 10[G21K, H05H]
2009/0227,870 METHOD OF DETERMINING A PARAMETER REPRESENTING AN ACOUSTIC PROPERTY OF A MATERIALAbandonedAug 31, 04Sep 10, 09[G01N, A61B]
2009/0141,342 MULTI-LAYER MIRROR FOR RADIATION IN THE SOFT X-RAY AND XUV WAVELENGTH RANGEAbandonedDec 15, 05Jun 04, 09[G21K, G02B]
2004/0233,519 Multi-layer mirror for radiation in the xuv wavelenght range and method for manufacture thereofAbandonedMay 21, 04Nov 25, 04[G02B]
6463312 Microdialysis-probe integrated with a si-chipExpiredSep 12, 00Oct 08, 02[A61B]
6049079 Apparatus for detecting a photon pulseExpiredOct 20, 97Apr 11, 00[H01J, G04F]
4307351 Gas laserExpiredNov 09, 79Dec 22, 81[H01S]
4207540 Gas laser systemExpiredFeb 09, 78Jun 10, 80[H01S]
4185255 Set-up for a transversely excited laser operating at atmospheric pressureExpiredMay 23, 77Jan 22, 80[H01S]

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