Semiconductor Diagnostics, Inc.
Patent Owner
Stats
- 5 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Jan 10, 2012 most recent publication
Details
- 5 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 540 Total Citation Count
- Sep 26, 1994 Earliest Filing
- 7 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
8093920 Accurate measuring of long steady state minority carrier diffusion lengthsAug 21, 09Jan 10, 12[G01R]
6680621 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentMay 08, 01Jan 20, 04[G01N, G01R]
6037797 Measurement of the interface trap charge in an oxide semiconductor layer interfaceJul 11, 97Mar 14, 00[G01R]
5773989 Measurement of the mobile ion concentration in the oxide layer of a semiconductor waferJul 14, 95Jun 30, 98[G01R]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2009/0047,748 ENHANCED SENSITIVITY NON-CONTACT ELECTRICAL MONITORING OF COPPER CONTAMINATION ON SILICON SURFACEAbandonedMay 30, 08Feb 19, 09[H01L]
7405580 Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentrationExpiredMar 16, 06Jul 29, 08[G01R]
6771091 Method and system for elevated temperature measurement with probes designed for room temperature measurementExpiredSep 24, 02Aug 03, 04[G01R]
6569691 Measurement of different mobile ion concentrations in the oxide layer of a semiconductor waferExpiredNov 15, 00May 27, 03[H01L]
6538462 Method for measuring stress induced leakage current and gate dielectric integrity using corona dischargeExpiredNov 30, 99Mar 25, 03[G01R]
6114865 Device for electrically contacting a floating semiconductor wafer having an insulating filmExpiredApr 21, 99Sep 05, 00[G01R]
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