Systems on Silicon Manufacturing Co. Pte. Ltd.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 6356
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 264
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
G21F PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR 121

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8629032 Non-volatile memory cell structure and a method of fabricating the sameJan 18, 11Jan 14, 14[H01L]
8564043 EEPROM cell structure and a method of fabricating the sameJan 13, 11Oct 22, 13[H01L]
7778798 System and method for measuring tool performanceOct 12, 06Aug 17, 10[G06F]
7772590 Metal comb structures, methods for their fabrication and failure analysisMar 05, 07Aug 10, 10[H01L]
7693667 Method and system for determining a predicted flash endurance Vt of a flash cell after N program/erase cyclesNov 24, 06Apr 06, 10[G06F, G11C]
7351990 Analyzer magnet chamber linerOct 28, 05Apr 01, 08[G21F]
7247084 Polishing head elbow fittingSep 14, 05Jul 24, 07[B24B]
7230439 Method for detecting and monitoring wafer probing process instabilityFeb 05, 03Jun 12, 07[G01R]
7208363 Fabrication of local interconnect linesMay 05, 05Apr 24, 07[H01L]
7208965 Planar view TEM sample preparation from circuit layer structuresDec 23, 04Apr 24, 07[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0278,697 METAL-INSULATOR-METAL CAPACITOR AND METHOD FOR FABRICATING METAL-INSULATOR-METAL CAPACITOR STRUCTURESAbandonedMay 17, 10Nov 17, 11[H01L]
7663743 Sensing systemExpiredMay 16, 07Feb 16, 10[G01J, G01B]
7642798 Probe card needle cleaning frequency optimizationExpiredFeb 05, 03Jan 05, 10[G01R]
2009/0146,222 METHOD FOR FABRICATION OF SINGLE ELECTRON TRANSISTORSAbandonedDec 06, 07Jun 11, 09[H01L]
2008/0232,162 One time programming cell structure and method of fabricating the sameAbandonedMar 23, 07Sep 25, 08[H01L, G11C]
2008/0168,932 Thermocouple calibration in a furnaceAbandonedJan 16, 07Jul 17, 08[G01K, F23M]
7400391 System and method for detection of spatial signature yield lossExpiredFeb 15, 07Jul 15, 08[G01N]
7394280 Method of electro migration testingExpiredFeb 06, 07Jul 01, 08[G01R]
7355173 Delineation of wafersExpiredJan 06, 05Apr 08, 08[G01N]
2008/0047,161 Semiconductor drying process apparatusAbandonedAug 24, 06Feb 28, 08[F26B]
2008/0016,486 System and method of assessing reliability of a semiconductorAbandonedMay 03, 06Jan 17, 08[H03K, H01L, G06F, G01R]
7317188 TEM sample preparation from a circuit layer structureExpiredApr 27, 05Jan 08, 08[G01N]
2007/0262,030 Cmp Slurry StrainerAbandonedSep 24, 03Nov 15, 07[B08B, B01D]
2007/0258,505 APPARATUS FOR THERMOCOUPLE SETTING AND FLAT ZONE PROCEDURE IN A FURNACEAbandonedMay 05, 06Nov 08, 07[G01K]
2007/0222,471 Front and back side dynamically-biased photon emission microscopyAbandonedMar 23, 06Sep 27, 07[G01R]
7272760 Curve tracing device and methodExpiredNov 18, 04Sep 18, 07[G01R]
2007/0185,683 Method and system for deriving time-dependent dielectric breakdown lifetimeAbandonedFeb 09, 06Aug 09, 07[G06F]
2007/0177,963 End effector for transferring a waferAbandonedFeb 01, 06Aug 02, 07[H01L]
2007/0163,714 Etch chamberAbandonedJan 18, 06Jul 19, 07[C03C, H01L, C23F]
2007/0095,786 Selective reactive ion etching of wafersAbandonedDec 19, 06May 03, 07[C23F]

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