TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology MATTERS Rank in Class
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 13246 1
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1271 61
 
 
G11C STATIC STORES 1030 10
 
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 792 4
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 372 15
 
 
H03K PULSE TECHNIQUE 313 17
 
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 173 3
 
 
C23C COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL 172 14
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 166 64
 
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 160 10
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0073,144 CONTROL SYSTEM FOR PLASMA CHAMBER HAVING CONTROLLABLE VALVE AND METHOD OF USING THE SAME Nov 27, 17 Mar 15, 18 [C23C, H01J]
2018/0073,934 THERMAL DETECTION CIRCUIT Nov 20, 17 Mar 15, 18 [G01K]
2018/0075,181 METHOD AND SYSTEM FOR PIN LAYOUT May 25, 17 Mar 15, 18 [G06F]
2018/0075,182 INTEGRATED CIRCUIT AND METHOD OF FORMING AN INTEGRATED CIRCUIT Aug 22, 17 Mar 15, 18 [G06F]
2018/0076,097 Nonplanar Device and Strain-Generating Channel Dielectric Nov 07, 17 Mar 15, 18 [H01L]
2018/0076,109 INTERCONNECT ARRANGEMENT WITH STRESS-REDUCING STRUCTURE AND METHOD OF FABRICATING THE SAME Nov 09, 17 Mar 15, 18 [H01L]
2018/0076,129 SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF Jan 19, 17 Mar 15, 18 [H01L]
2018/0076,132 Self-Aligned Interconnection Structure and Method Nov 13, 17 Mar 15, 18 [H01L]
2018/0076,141 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Nov 17, 17 Mar 15, 18 [H01L]
2018/0076,184 Semiconductor Packages having Dummy Connectors and Methods of Forming Same Aug 04, 17 Mar 15, 18 [H01L]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9919350 Cup-wash device, semiconductor apparatus, and cup cleaning method Mar 16, 15 Mar 20, 18 [B08B, H01L]
9919914 MEMS devices including MEMS dies and connectors thereto May 20, 16 Mar 20, 18 [B81C, B81B, H01L]
9921254 Circuit and method for bandwidth measurement May 28, 15 Mar 20, 18 [G01R, H03F, G06F]
9921467 Mask blank and mask and fabrication method thereof Nov 30, 15 Mar 20, 18 [G03F, H01L]
9921480 Extreme ultraviolet photoresist Feb 10, 16 Mar 20, 18 [G03F]
9921493 Photolithography system, method for transporting photo-mask and unit therein Nov 14, 13 Mar 20, 18 [G03F, H01L]
9922160 Integrated circuit stack verification method and system for performing the same Feb 12, 15 Mar 20, 18 [G06F, H01L]
9922162 Resistive capacitance determination method for multiple-patterning-multiple spacer integrated circuit layout Dec 21, 15 Mar 20, 18 [G03F, G06F]
9922700 Memory read stability enhancement with short segmented bit line architecture May 24, 16 Mar 20, 18 [G11C]
9922701 Pre-charging bit lines through charge-sharing Aug 08, 16 Mar 20, 18 [G11C]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0052,218 TESTING UNIT AND TESTING APPARATUS USING THE SAME ABAN Jan 07, 16 Feb 23, 17 [G01R]
2017/0033,012 METHOD FOR FABRICATING FIN OF FINFET OF SEMICONDUCTOR DEVICE ABAN Jul 31, 15 Feb 02, 17 [H01L]
2016/0322,473 Buffer Layer on Gate and Methods of Forming the Same ABAN May 21, 15 Nov 03, 16 [H01L]
2016/0260,704 High Voltage Device with a Parallel Resistor ABAN Mar 04, 15 Sep 08, 16 [H01L]
2016/0252,815 Photoresist with Floating-OOB-Absorption Additive ABAN Feb 26, 15 Sep 01, 16 [G03F, H01L]
2016/0240,623 VERTICAL GATE ALL AROUND (VGAA) DEVICES AND METHODS OF MANUFACTURING THE SAME ABAN Feb 13, 15 Aug 18, 16 [H01L]
2016/0240,775 SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME ABAN Oct 16, 15 Aug 18, 16 [H01L]
9406780 Semiconductor device and method Withdrawn Jan 09, 15 Aug 02, 16 [H01L]
2016/0209,860 BANDGAP REFERENCE VOLTAGE CIRCUIT ABAN Jan 20, 15 Jul 21, 16 [G05F]
9379093 Method and apparatus for image sensor packaging Withdrawn Apr 27, 12 Jun 28, 16 [H01L]
9379211 Fabricating method of semiconductor device Withdrawn Dec 07, 15 Jun 28, 16 [H01L]
9355885 Wafer support device Withdrawn Aug 23, 12 May 31, 16 [B23B, B05C, B05D, H01L]
2016/0091,916 Bandgap Circuits and Related Method ABAN Sep 30, 14 Mar 31, 16 [G05F]
2016/0077,544 CLOCK GATING CIRCUITS AND CIRCUIT ARRANGEMENTS INCLUDING CLOCK GATING CIRCUITS ABAN Sep 17, 14 Mar 17, 16 [G06F]
2016/0064,239 Method for Integrated Circuit Patterning ABAN Mar 11, 15 Mar 03, 16 [H01L]
2016/0035,563 APPARATUS AND METHOD FOR PROCESSING SEMICONDUCTOR WAFERS ABAN Aug 01, 14 Feb 04, 16 [B08B, H01J, H01L]
2016/0035,667 Methods of Packaging Semiconductor Devices and Packaged Semiconductor Devices ABAN Jul 30, 14 Feb 04, 16 [H01L]
2016/0027,692 Method of Semiconductor Integrated Circuit Fabrication ABAN Oct 05, 15 Jan 28, 16 [H01L]
2015/0348,874 3DIC Interconnect Devices and Methods of Forming Same ABAN Aug 25, 14 Dec 03, 15 [H01L]
2015/0333,753 IO AND PVT CALIBRATION USING BULK INPUT TECHNIQUE ABAN May 16, 14 Nov 19, 15 [H03K]

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