TELEDYNE LECROY, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 6996
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 32415
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 1398
 
  
 
G09G ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION 8143
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 8277
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 5130
 
  
 
H04B TRANSMISSION 5205
 
  
 
H03F AMPLIFIERS 479
 
  
 
1004 OTHER MEASURING INSTRUMENTS, APPARATUS AND DEVICES432
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 3195

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0285,902 Modifying Settings of an Electronic Test or Measurement InstrumentDec 21, 16Oct 05, 17[G06F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9843402 Noise analysis to reveal jitter and crosstalk's effect on signal integrityOct 04, 16Dec 12, 17[H04L, H04B]
9660661 High bandwidth oscilloscopeApr 20, 16May 23, 17[H03M, G06F, G01R]
9525603 Field selection graphical user interfaceDec 19, 12Dec 20, 16[H04L, G06F]
9496993 Noise analysis to reveal jitter and crosstalk's effect on signal integrityJan 11, 13Nov 15, 16[H04L]
9404940 Compensating probing tip optimized adapters for use with specific electrical test probesMar 03, 13Aug 02, 16[G01R]
9366743 Time domain network analyzerMar 05, 14Jun 14, 16[G06F, G01R]
9325342 High bandwidth oscilloscopeOct 04, 13Apr 26, 16[H03M, G06F, G01R]
9231608 Method and apparatus for correction of time interleaved ADCsJul 16, 15Jan 05, 16[H03M]
9194930 Method for de-embedding in network analysisJun 20, 11Nov 24, 15[G01R]
9140724 Compensating resistance probing tip optimized adapters for use with specific electrical test probesNov 08, 11Sep 22, 15[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0343,883 User Interface for Signal Integrity Network AnalyzerAbandonedMay 15, 13Nov 20, 14[G01R]
2014/0098,848 Time Domain Reflectometry Step to S-Parameter ConversionAbandonedDec 16, 13Apr 10, 14[H04L]
2011/0286,506 User Interface for Signal Integrity Network AnalyzerAbandonedSep 28, 10Nov 24, 11[H04B]
2009/0281,758 Method and Apparatus for Triggering a Test and Measurement InstrumentAbandonedMay 08, 08Nov 12, 09[G06F]
2009/0093,986 Method and Apparatus for Elimination of Spurious Response due to Mixer Feed-ThroughAbandonedOct 03, 08Apr 09, 09[G01R]
2008/0303,820 Common Phase Error vs. Time DisplayAbandonedMay 28, 08Dec 11, 08[G06T]
7009377 Cartridge system for a probing head for an electrical test probeExpiredNov 22, 04Mar 07, 06[G01R]
6863576 Electrical test probe flexible spring tipExpiredDec 13, 01Mar 08, 05[H01R]
6828769 Cartridge system for a probing head for an electrical test probeExpiredJun 27, 03Dec 07, 04[G01R]
6809535 Notched electrical test probe tipExpiredFeb 10, 03Oct 26, 04[G01R]

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