TEMPTRONIC CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
F25B REFRIGERATION MACHINES, PLANTS, OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS 464
 
  
 
F25D REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT COVERED BY ANY OTHER SUBCLASS 442
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 3153
 
  
 
F16L PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL268
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2204
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 145
 
  
 
H01B CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING, OR DIELECTRIC PROPERTIES 173
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0261,547 Temperature Forcing System and Method with Conductive Thermal ProbesFeb 21, 17Sep 14, 17[G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9335080 Temperature system having an impurity filterOct 17, 11May 10, 16[H01L, F25B, H05K]
8602641 Environmental test system and method with in-situ temperature sensing of device under test (DUT)Oct 26, 11Dec 10, 13[G01N]
8408020 Temperature-controlled enclosures and temperature control system using the sameNov 04, 09Apr 02, 13[F16L, G01K, G01N, F25D, H05K]
7629533 Temperature-controlled enclosures and temperature control system using the sameMar 13, 07Dec 08, 09[H05K]
7603871 High-flow cold air chillerJun 29, 06Oct 20, 09[F25B]
6886347 Workpiece chuck with temperature control assembly having spacers between layers providing clearance for thermoelectric modulesJul 10, 03May 03, 05[F25B, F25D]
6745575 Workpiece chuck with temperature control assembly having spacers between layers providing clearance for thermoelectric modulesJul 11, 02Jun 08, 04[F25B, F25D]
6552561 Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diodeApr 20, 01Apr 22, 03[G01R]
6545494 Apparatus and method for controlling temperature in a wafer using integrated temperature sensitive diodeJul 10, 00Apr 08, 03[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0064,323 ENVIRONMENTAL TEST SYSTEM AND METHOD WITH IN-SITU TEMPERATURE SENSING OF DEVICE UNDER TEST (DUT)AbandonedNov 04, 13Mar 06, 14[G01N]
2013/0091,876 TEMPERATURE CONTROL SYSTEM AND METHOD FOR A CHAMBER OR PLATFORM AND TEMPERATURE-CONTROLLED CHAMBER OR PLATFORM INCLUDING THE TEMPERATURE CONTROL SYSTEMAbandonedOct 18, 11Apr 18, 13[F25B, G05D, F25D]
2009/0100,945 APPARATUS AND METHOD FOR SELF-ALIGNING A THERMAL CAP AND FOR CONNECTING TO A SOURCE OF TEMPERATURE-CONTROLLED FLUIDAbandonedOct 19, 07Apr 23, 09[G01N, F16C, B65D]
2008/0231,304 Apparatus and method for controlling temperature in a chuck systemAbandonedApr 01, 08Sep 25, 08[G01R]
2008/0188,990 Apparatus and method for controlling temperature in a chuck systemAbandonedApr 01, 08Aug 07, 08[G05B]
7331097 Method of manufacturing a workpiece chuckExpiredAug 17, 04Feb 19, 08[B23P]
2006/0196,653 Apparatus and method for controlling temperature in a chuck systemAbandonedFeb 27, 06Sep 07, 06[F24F]
6969830 Wafer chuck having thermal plate with interleaved heating and cooling elementsExpiredJun 19, 03Nov 29, 05[C27C, H01B]
2005/0217,583 Wafer chuck having thermal plate with interleaved heating and cooling elementsAbandonedJun 07, 05Oct 06, 05[C23C]
2005/0121,186 Apparatus and method for reducing electrical noise in a thermally controlled chuckAbandonedNov 23, 04Jun 09, 05[F25B, F28F]
6866094 Temperature-controlled chuck with recovery of circulating temperature control fluidExpiredMay 15, 01Mar 15, 05[B23Q, H01L, F25B, F28F]
6867611 Temperature-controlled thermal platform for automated testingExpiredMar 16, 04Mar 15, 05[F25B, G01R]
6802368 Temperature control system for a workpiece chuckExpiredJan 16, 02Oct 12, 04[F25B]
6744270 Temperature-controlled thermal platform for automated testingExpiredJul 18, 01Jun 01, 04[G01R]
6700099 Wafer chuck having thermal plate with interleaved heating and cooling elements, interchangeable top surface assemblies and hard coated layer surfacesExpiredJul 06, 01Mar 02, 04[C23C, H01B]
6540014 Workpiece chuckExpiredFeb 29, 00Apr 01, 03[B25B, F28F]
6505478 Heat exchanger having sloped deflection surface for directing refrigerantExpiredJul 11, 00Jan 14, 03[F28D, F25B]
6415858 Temperature control system for a workpiece chuckExpiredDec 31, 97Jul 09, 02[F25B]
6375176 Workpiece chuck with guard layer having vacuum distribution patternExpiredDec 16, 99Apr 23, 02[B25B]
6328096 Workpiece chuckExpiredDec 28, 99Dec 11, 01[B25B, F28F]

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