TERADYNE, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 21831
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 76371
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 26130
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 2091
 
  
 
H03K PULSE TECHNIQUE 19112
 
  
 
G11B INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER 15123
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 13272
 
  
 
H04B TRANSMISSION 11199
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 8125
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 872

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0292,873 VIBRATION TESTING TOOLApr 07, 16Oct 12, 17[G01H, G11B, H05K]
2017/0059,635 CONDUCTIVE TEMPERATURE CONTROLAug 31, 15Mar 02, 17[G01R, B25J]
2016/0131,702 ASSEMBLING DEVICES FOR PROBE CARD TESTINGNov 10, 14May 12, 16[H01L, G01R]
2015/0276,799 CURRENT REGULATION FOR ACCURATE AND LOW-COST VOLTAGE MEASUREMENTS AT THE WAFER LEVELMar 26, 14Oct 01, 15[G01R]
2014/0262,149 AIR CIRCULATION IN A SYSTEMMar 15, 13Sep 18, 14[H05K]
2013/0111,505 PROGRAMMABLE TEST INSTRUMENTOct 28, 11May 02, 13[G06F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9880199 Probe alignment connection deviceAug 21, 14Jan 30, 18[G01R]
9791511 Method and apparatus for low latency communication in an automatic testing systemMar 15, 13Oct 17, 17[G01N, G01R]
9784555 Determining electrical path lengthNov 25, 15Oct 10, 17[H03K, G01R, G01B, G01D, G06K]
9786977 Pocketed circuit boardDec 10, 15Oct 10, 17[H01P, H05K]
9778314 Capacitive opens testing of low profile componentsAug 25, 14Oct 03, 17[G01R]
9779780 Damping vibrations within storage device testing systemsJun 17, 10Oct 03, 17[G11B]
9772378 Multi-stage equalizationAug 28, 14Sep 26, 17[G01R]
9766287 Thermal controlOct 22, 14Sep 19, 17[G01K, H01L, G01R]
9759772 Programmable test instrumentOct 28, 11Sep 12, 17[G01L, G01R]
9762382 Time-aligning a signalFeb 18, 16Sep 12, 17[H04L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0271,064 PARALLEL OPERATION OF SYSTEM COMPONENTSAbandonedMar 15, 13Sep 18, 14[G11B]
2013/0256,967 MANAGING ENERGY TRANSMISSIONAbandonedMar 06, 13Oct 03, 13[B23Q]
2013/0071,224 STORAGE DEVICE TESTING SYSTEMSAbandonedSep 20, 12Mar 21, 13[A47B, B65G]
2012/0136,477 Storage Device Transport, Clamping And TestingAbandonedApr 17, 09May 31, 12[B65G, G06F, H05K]
2012/0106,351 Determining a Logic State of a DeviceAbandonedNov 03, 11May 03, 12[H04L]
2012/0102,374 STORAGE DEVICE TESTINGAbandonedApr 17, 09Apr 26, 12[G06F, B65H, B25J, G11C]
2012/0081,079 EMERGENCY DISCHARGE FEATUREAbandonedOct 05, 10Apr 05, 12[H02J]
2012/0034,054 Transferring Disk Drives Within Disk Drive Testing SystemsAbandonedOct 19, 11Feb 09, 12[B65G]
2011/0316,545 Electronic Detection of SignaturesAbandonedJun 29, 10Dec 29, 11[G01N]
2011/0316,546 Zero Insertion Force Scrubbing ContactAbandonedJun 29, 10Dec 29, 11[G01N]
2011/0313,569 Transferring Storage Devices within Storage Device Testing SystemsAbandonedJun 17, 10Dec 22, 11[B25J]
2011/0305,132 Management Of Air-Borne VibrationAbandonedJun 14, 10Dec 15, 11[G11B]
2011/0261,483 CHANGING THE COMPOSITION AND/OR DENSITY OF GASES INSIDE OF ASSEMBLIES DURING MANUFACTURINGAbandonedApr 20, 11Oct 27, 11[F17D, G11B]
2011/0236,163 BULK TRANSFER OF STORAGE DEVICES USING MANUAL LOADINGAbandonedMar 22, 11Sep 29, 11[B65G, B25J]
2011/0123,301 BULK FEEDING STORAGE DEVICES TO STORAGE DEVICE TESTING SYSTEMSAbandonedApr 16, 09May 26, 11[B65G, B25J]
7890207 Transferring storage devices within storage device testing systemsExpiredMar 18, 10Feb 15, 11[G06F]
2010/0265,609 DISK DRIVE TRANSPORT, CLAMPING AND TESTINGAbandonedJul 12, 10Oct 21, 10[G11B, H05K]
2010/0265,610 DISK DRIVE TRANSPORT, CLAMPING AND TESTINGAbandonedJul 12, 10Oct 21, 10[G11B]
2010/0235,126 COMPENSATING FOR HARMONIC DISTORTION IN AN INSTRUMENT CHANNELAbandonedMar 16, 10Sep 16, 10[G06F]
2009/0262,455 Temperature Control Within Disk Drive Testing SystemsAbandonedApr 17, 08Oct 22, 09[G11B]

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