THERMO NITON ANALYZERS LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 19187
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 375
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 151
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 145
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8184287 Multiple-light-path front end for OES instrumentAug 25, 09May 22, 12[G01N]
8155268 Rapid screening for lead concentration compliance by X-ray fluorescence (XRF) analysisApr 23, 10Apr 10, 12[G01N]
8022349 Linear sensor array for an optical spectroscopy device and methods of use thereofFeb 22, 08Sep 20, 11[H01J, H01L]
7933379 Measurement of lead by X-ray fluorescenceMar 17, 10Apr 26, 11[G01N]
7916834 Small spot X-ray fluorescence (XRF) analyzerFeb 11, 08Mar 29, 11[G01N]
7899153 Automated x-ray fluorescence analysisApr 17, 09Mar 01, 11[G01N]
7875847 Docking stand for analytical instrumentAug 28, 08Jan 25, 11[G01J, G01N, B01D]
7821634 Laser-triggered plasma apparatus for atomic emission spectroscopyApr 18, 08Oct 26, 10[G01J]
7787589 In vivo measurement of trace elements in bone by x-ray fluorescenceApr 30, 09Aug 31, 10[G01N]
7702067 Measurement of lead by X-ray fluorescenceSep 05, 08Apr 20, 10[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0142,200 Small Spot X-Ray Fluorescence (XRF) AnalyzerAbandonedFeb 25, 11Jun 16, 11[G01N]
2011/0079,734 Elemental Analysis Based on Complementary TechniquesAbandonedSep 30, 10Apr 07, 11[G01N]
2010/0310,041 X-Ray System and Methods with Detector Interior to Focusing ElementAbandonedJun 03, 10Dec 09, 10[G01N]
2010/0226,476 Low-Profile X-Ray Fluorescence (XRF) AnalyzerAbandonedMar 05, 10Sep 09, 10[G01N]
2009/0251,007 Hot-Swappable Battery Retrofit ModuleAbandonedMar 18, 09Oct 08, 09[H02J]
2009/0079,980 Compact Cross-Dispersed Spectrometer for Extended Spectral RangeAbandonedFeb 22, 08Mar 26, 09[G01J, G02B]
2009/0064,276 Analytical Instrument with Automatic Lockout against Unauthorized UseAbandonedAug 28, 08Mar 05, 09[G06F, B01J]
2009/0057,422 Contactless Memory Information Storage for Sample Analysis and Hand-Holdable Analyzer for Use TherewithAbandonedAug 28, 08Mar 05, 09[H01J, G01J, G01N, G06K]
7302034 Analysis of elemental composition and thickness in multilayered materialsExpiredOct 04, 06Nov 27, 07[G01B]
7266178 Calibration source for X-ray detectorsExpiredMay 19, 03Sep 04, 07[H01J]
7236568 Miniature x-ray source with improved output stability and voltage standoffExpiredMar 23, 05Jun 26, 07[H01J]
2005/0023,479 Neutron and gamma ray monitorAbandonedJun 04, 04Feb 03, 05[G01N, G01T]

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